METHOD OF MONITORING A DRESSING PROCESS AND POLISHING APPARATUS
First Claim
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1. A method of monitoring dressing of a polishing pad, said method comprising:
- rotating a polishing table that supports the polishing pad;
dressing the polishing pad by pressing a dresser against the polishing pad while causing the dresser to oscillate in a radial direction of the polishing pad;
calculating a work coefficient representing a ratio of a frictional force between the dresser and the polishing pad to a force of pressing the dresser against the polishing pad; and
monitoring dressing of the polishing pad based on the work coefficient.
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Abstract
A method of monitoring dressing of a polishing pad is provided. The method includes: rotating a polishing table that supports the polishing pad; dressing the polishing pad by pressing a dresser against the polishing pad while causing the dresser to oscillate in a radial direction of the polishing pad; calculating a work coefficient representing a ratio of a frictional force between the dresser and the polishing pad to a force of pressing the dresser against the polishing pad; and monitoring dressing of the polishing pad based on the work coefficient.
18 Citations
16 Claims
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1. A method of monitoring dressing of a polishing pad, said method comprising:
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rotating a polishing table that supports the polishing pad; dressing the polishing pad by pressing a dresser against the polishing pad while causing the dresser to oscillate in a radial direction of the polishing pad; calculating a work coefficient representing a ratio of a frictional force between the dresser and the polishing pad to a force of pressing the dresser against the polishing pad; and monitoring dressing of the polishing pad based on the work coefficient. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A polishing apparatus for polishing a substrate, comprising:
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a polishing table that supports a polishing pad; a table motor configured to rotate the polishing table; a dresser configured to dress the polishing pad; a swing motor configured to cause the dresser to oscillate in a radial direction of the polishing pad; a pressing device configured to press the dresser against the polishing pad; and a pad monitoring device configured to monitor dressing of the polishing pad, the pad monitoring device being configured to calculate a work coefficient representing a ratio of a frictional force between the dresser and the polishing pad to a force of pressing the dresser against the polishing pad, and monitor dressing of the polishing pad based on the work coefficient. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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Specification