Method and System For Detecting Arc Faults and Flashes Using Wavelets
First Claim
1. A computer-implemented method for detecting an arc event occurring in an electrical system, comprising:
- sensing a voltage using a voltage sensing device coupled to a component of the electrical system, wherein the component need not be conductively directly connected to an occurrence location of the arc event in the electrical system;
producing a signal waveform representative of the sensed voltage using the voltage sensing device;
sampling at a predetermined frequency the voltage signal waveform to generate a plurality of sample waveforms;
applying a wavelet transform to each of the plurality of sample waveforms to decompose them into a predetermined number of waveforms using a corresponding number of successive wavelet components, wherein each of the successive wavelet components is a time-domain waveform that spans a predetermined range of frequencies;
dividing each waveform into a plurality of segments;
analyzing the plurality of segments to detect a change in one of the characteristics of the corresponding detailed waveform within the segments and/or between the segments; and
determining an occurrence of the arc event based on the detected change of one or more of the properties of the corresponding plurality of waveforms.
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Abstract
A method for detecting an arc event occurring in an electrical system includes sensing a voltage using a voltage sensing device coupled to a component of the electrical system, producing a signal waveform representative of the sensed voltage using the voltage sensing device, and sampling at a predetermined frequency the voltage signal waveform to generate a plurality of sample waveforms. The method further includes applying a wavelet transform to each sample waveform to decompose them into a predetermined number of detailed waveforms using a corresponding number of successive wavelet components, dividing each detailed waveform into a plurality of segments, analyzing the plurality of segments to detect a change in one or more of the properties of the corresponding detailed waveform, and determining an occurrence of the arc event based on the duration of the detected change of one or more of characteristics of the corresponding detailed waveform.
15 Citations
22 Claims
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1. A computer-implemented method for detecting an arc event occurring in an electrical system, comprising:
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sensing a voltage using a voltage sensing device coupled to a component of the electrical system, wherein the component need not be conductively directly connected to an occurrence location of the arc event in the electrical system; producing a signal waveform representative of the sensed voltage using the voltage sensing device; sampling at a predetermined frequency the voltage signal waveform to generate a plurality of sample waveforms; applying a wavelet transform to each of the plurality of sample waveforms to decompose them into a predetermined number of waveforms using a corresponding number of successive wavelet components, wherein each of the successive wavelet components is a time-domain waveform that spans a predetermined range of frequencies; dividing each waveform into a plurality of segments; analyzing the plurality of segments to detect a change in one of the characteristics of the corresponding detailed waveform within the segments and/or between the segments; and determining an occurrence of the arc event based on the detected change of one or more of the properties of the corresponding plurality of waveforms. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system for detecting an arc event occurring in an electrical system, comprising:
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a voltage sensing device for sensing a voltage, wherein the voltage sensing device is coupled to a component of the electrical system, wherein the component is not conductively directly connected to an occurrence location of the arc event in the electrical system, wherein the voltage sensing device produces a signal waveform representative of the sensed voltage; and a controller configured to; sample at a predetermined frequency the voltage signal waveform to generate a plurality of sample waveforms; apply a wavelet transform to each of the plurality of sample waveforms to decompose them into a predetermined number of detailed waveforms using a corresponding number of successive wavelet components, wherein each of the successive wavelet components is a time-domain waveform that covers a predetermined frequency band; divide each detailed waveform into a plurality of segments; analyze the plurality of segments to detect a change in one of the properties of the corresponding detailed waveform within the segments and/or between the segments; and determine an occurrence of the arc event based on the detected change of one of the properties of the corresponding detailed waveform. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18)
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19. A computing system, comprising:
a processing unit and a memory unit for storing instructions that are operable, when executed by the processing unit, to perform a method for detecting an arc event occurring in an electrical system, the method comprising; sensing a voltage using a voltage sensing device coupled to a component of the electrical system, wherein the component is not conductively directly connected to an occurrence location of the arc event in the electrical system; producing a signal waveform representative of the sensed voltage using the voltage sensing device; sampling at a predetermined frequency the voltage signal waveform to generate a plurality of sample waveforms; applying a wavelet transform to each of the plurality of sample waveforms to decompose them into a predetermined number of detailed waveforms using a corresponding number of successive wavelet components, wherein each of the successive wavelet components is a time-domain waveform that covers a predetermined frequency band; partitioning each detailed waveform into a plurality of segments; analyzing the plurality of segments to detect a change in one of the properties of the corresponding detailed waveform within the segments and/or between the segments; and determining an occurrence of the arc event based on the detected change of one of the properties of the corresponding detailed waveform. - View Dependent Claims (20, 21, 22)
Specification