ION ANALYSIS APPARATUS AND METHOD

• US 20140070087A1
• Filed: 03/16/2012
• Published: 03/13/2014
• Est. Priority Date: 03/18/2011
• Status: Active Grant

• Current Assignee: Shimadzu Corporation
• Original Assignee: Matthew Clive Gill
• Inventors: Giles, Roger, Gill, Matthew Clive
• Granted Patent: US 8,981,287 B2
• Time in Patent Office: Days
• US Class Current: 250/282
• CPC Class Codes: H01J 49/062 Ion guides linear ion traps performing mass selection H01J49/4225, mass filters H01J49/421
• CPC Class Codes: H01J 49/40 Time-of-flight spectrometers H01J49/36 takes precedence
• CPC Class Codes: H01J 49/401 characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode
• CPC Class Codes: H01J 49/403 characterised by the acceleration optics and/or the extraction fields

Abstract

The present invention is concerned with an ion analysis apparatus comprising an ion guide having an ion optical axis extending from an ion inlet to an ion outlet, the ion guide being configured to guide ions from the ion inlet to the ion outlet along the ion optical axis, wherein the ion guide comprises at least one extraction region located between the ion inlet and the ion outlet, the at least one extraction region being configured to extract ions moving along the ion optical axis of the ion guide in an extraction direction, the extraction direction being substantially orthogonal to the ion optical axis of the ion guide, wherein the apparatus includes ion radial confinement means that in use confine the ions in the radial direction within the ion guide.

Claims

1. An ion analysis apparatus comprising an ion guide having an ion optical axis extending from an ion inlet to an ion outlet, the ion guide being configured to guide ions from the ion inlet to the ion outlet along the ion optical axis, wherein the ion guide comprises at least one extraction region located between the ion inlet and the ion outlet, the at least one extraction region being configured to extract ions moving along the ion optical axis of the ion guide in an extraction direction, the extraction direction being substantially orthogonal to the ion optical axis of the ion guide, wherein the apparatus includes an ion radial confinement device that in use confines the ions in the radial direction within the ion guide, said ion radial confinement device comprising a first ion radial confinement device associated with a portion of the ion guide located before the extraction region and a second ion radial confinement device associated with the at least one extraction region, and wherein the extraction region is switchable between an extraction mode and a transmission mode.

2. An ion analysis apparatus according to claim 1, wherein the ion guide is a linear ion guide and the ion optical axis is the longitudinal axis of the linear ion guide.

3. An ion analysis apparatus according to claim 1, wherein the apparatus includes an ion axial guide that in use causes the ions to move along the ion optical axis, said ion axial guide comprising a voltage supply to generate an axial potential gradient from the ion inlet towards the ion outlet.

4. An ion analysis apparatus according to claim 1, wherein the ion radial confinement device comprises a first RF waveform supply associated with the portion of the ion guide located before the extraction region, and a second RF waveform supply associated with the at least one extraction region.

5. An ion analysis apparatus according to claim 1, wherein the ion guide comprises a quadrupole.

6. An ion analysis apparatus according to claim 1, wherein the ion guide is segmented and the at least one extraction region comprises a single segment of the ion guide.

7. An ion analysis apparatus according to claim 1, wherein the apparatus includes an ion packeting device to produce a series of moving ion packets along the ion optical axis.

8. An ion analysis apparatus according to claim 7, wherein the ion guide comprises a first set of electrodes, being continuous electrodes, and an associated ion radial confinement device to radially confine the ions along the ion optical axis, and a second set of electrodes, being segmented electrodes, and an associated ion axial guide to guide the ions along the ion optical axis.

9. An ion analysis apparatus according to claim 8, wherein the ion radial confinement device associated with the first set of electrodes comprises an RF waveform supply, and the ion axial guide associated with the second set of electrodes comprises a varying DC voltage supply.

10. An ion analysis apparatus according claim 7, wherein the extraction of ions from the extraction region is synchronised with the arrival of ion packets in the extraction region.

11. An ion analysis apparatus according to claim 8, wherein the extraction region comprises an electrode with an aperture through which ions are extracted from the ion guide, and wherein the length of the aperture in the direction of the ion optical axis is substantially the same or greater than the length of a segment of the said second set of electrodes.

12. An ion analysis apparatus according to claim 1 wherein the ion guide has a first inscribed radius r₁ associated with a first region of the ion guide adjacent the ion inlet, and a second inscribed radius r₂ associated with a second region of the ion guide, the said second region being spaced along the ion optical axis from the said first region, wherein r₁>

r₂.

13. An ion analysis apparatus according to claim 12, wherein the ion guide comprises three regions along the ion optical axis, r₀ being constant within each region, wherein the relationship between r₁ of the first region, r₂ of the second region and r₃ of the third region is as follows:

r₁>

r₂>

r₃.

14. An ion analysis apparatus according to claim 1 wherein the ion guide has a first pressure region configured to be operated in use at a buffer gas pressure of P1, and a second pressure region configured to be operated in use at a buffer gas pressure of P2, such that in use the ions pass along the ion optical axis from the first pressure region, through the second pressure region to the extraction region, wherein P1>

P2.

15. An ion analysis apparatus according to claim 14, wherein P1>

10<sup>−

2</sup> mbar and P2<

10<sup>−

3</sup> mbar.

16. An ion analysis apparatus according to claim 1, wherein the apparatus includes a buffer gas supply for supplying a buffer gas to the ion guide.

17. An ion analysis apparatus according to claim 1, wherein the apparatus includes a time of flight mass analyser associated with the extraction region for mass analysis of extracted ions.

18. An ion analysis apparatus according to claim 1, wherein the apparatus is a time of flight mass spectrometer.

19. A method of extracting ions in an ion analysis apparatus, the said ion analysis apparatus comprising an ion guide having an ion optical axis and an extraction region and wherein ions are moving along the ion optical axis, the method comprising the steps of radially confining the ions within the ion guide and switching the extraction region from a transmission mode to an extraction mode thereby extracting ions from the ions moving along the ion optical axis in an extraction direction substantially orthogonal to the ion optical axis.

20. A method according to claim 19, wherein the method includes the step of producing ion packets from the ions moving along the ion optical axis and subsequently extracting at least some of the ion packets.