IDENTIFICATION OF INTEGRATED CIRCUITS
First Claim
1. A method to identify integrated circuits, the method comprising:
- evaluating measurements of one or more attributes for one or more circuit elements of an integrated circuit, wherein the measurements are associated with corresponding input vectors applied to the integrated circuit;
determining scaling factors for the selected one or more circuit elements, wherein the scaling factors reflect a relationship between nominal values for the attributes and measured values for the attributes;
transforming the determined scaling factors for the selected one or more circuit elements to generate transformed scaling factors; and
generating an identification number of the integrated circuit based on the transformed scaling factors.
2 Assignments
0 Petitions
Accused Products
Abstract
Techniques are generally described for generating an identification number for an integrated circuit (IC). In some examples, methods for generating an identification for an IC may comprise selecting circuit elements of the IC, evaluating measurements of an attribute of the IC for the selected circuit elements, wherein individual measurements are associated with corresponding input vectors previously applied to the IC, solving a plurality of equations formulated based at least in part on the measurements taken of the attribute of the IC for the selected circuit elements to determine scaling factors for the selected circuit elements, and transforming the determined scaling factors for the selected circuit elements to generate an identification number of the IC. Additional variants and embodiments may also be disclosed.
-
Citations
20 Claims
-
1. A method to identify integrated circuits, the method comprising:
-
evaluating measurements of one or more attributes for one or more circuit elements of an integrated circuit, wherein the measurements are associated with corresponding input vectors applied to the integrated circuit; determining scaling factors for the selected one or more circuit elements, wherein the scaling factors reflect a relationship between nominal values for the attributes and measured values for the attributes; transforming the determined scaling factors for the selected one or more circuit elements to generate transformed scaling factors; and generating an identification number of the integrated circuit based on the transformed scaling factors. - View Dependent Claims (2, 3, 4, 5, 6, 7)
-
-
8. A device effective to identify integrated circuits, the device comprising:
-
a storage unit effective to store an identification number for an integrated circuit; a processor configured in communication with the storage unit; the processor effective to perform or cause to be performed; evaluate measurements of one or more attributes for one or more circuit elements of the integrated circuit, wherein the measurements are associated with corresponding input vectors applied to the integrated circuit; determine scaling factors for the selected one or more circuit elements, wherein the scaling factors reflect a relationship between nominal values for the attributes and measured values for the attributes; transform the determined scaling factors for the selected one or more circuit elements to generate transformed scaling factors; and generate the identification number of the integrated circuit based on the transformed scaling factors. - View Dependent Claims (9, 10, 11, 12, 13, 14)
-
-
15. A combination of an integrated circuit and a device, the device effective to identify integrated circuits, the combination comprising:
-
the integrated circuit, wherein the integrated circuit is associated with an identification number and includes one or more circuit elements; and the device, the integrated circuit effective to; receive one or more input vectors at inputs of the one or more circuit elements; and generate outputs of the one or more circuit elements in response to the one or more input vectors; the device effective to perform or cause to be performed; evaluate measurements of one or more attributes for one or more circuit elements of the integrated circuit, wherein the measurements are associated with corresponding input vectors applied to the integrated circuit; determine scaling factors for the selected one or more circuit elements, wherein the scaling factors reflect a relationship between nominal values for the attributes and measured values for the attributes; transform the determined scaling factors for the selected one or more circuit elements to generate transformed scaling factors; and generate the identification number of the integrated circuit based on the transformed scaling factors. - View Dependent Claims (16, 17, 18, 19, 20)
-
Specification