SERIAL ADVANCED TECHNOLOGY ATTACHMENT DUAL IN-LINE MEMORY MODULE DEVICE HAVING TESTING CIRCUIT FOR CAPACITOR
First Claim
1. A serial advanced technology attachment dual in-line memory module (SATA DIMM) device, comprising:
- a capacitor;
a control chip;
a display device;
a testing chip storing a preset voltage, wherein a voltage pin of the testing chip is connected to a power source, a testing pin of the testing chip is connected to the capacitor; and
a selecting chip, wherein a voltage pin of the selecting chip is connected to the power source, a first input output (I/O) pin of the selecting chip is connected to a first I/O pin of the testing chip, a second I/O pin of the selecting chip is connected to a second I/O pin of the testing chip, a third I/O pin of the selecting chip is connected to an input pin of the control chip, a fourth I/O pin of the selecting chip is connected to an output pin of the control chip, a fifth I/O pin of the selecting chip is connected to the display device;
wherein when the SATA DIMM device is powered on, the control chip outputs a first signal to the fourth I/O pin of the selecting chip through the output pin of the control chip, the fourth I/O pin and the first I/O pin of the selecting chip are connected and output the first signal to the testing chip, the third I/O pin and the second I/O pin of the selecting chip are connected, the testing chip receives the first signal through the first I/O pin and measures a voltage of the capacitor through the testing pin and compares the measured voltage with the preset voltage, upon a condition that the testing voltage is equal to or greater than the preset voltage, the testing chip outputs a testing pass signal to the control chip through the second I/O pin of the testing chip, the second I/O pin of the selecting chip, and the third I/O pin of the selecting chip, the control chip receives the testing pass signal and outputs a second signal to the fourth I/O pin of the selecting chip through the output pin of the control chip, the third I/O pin of the selecting chip and the fifth I/O pin of the selecting chip are connected, the control chip controls the display device to display a testing result to show that the capacitor is qualified;
upon a condition that the measured voltage is less than the preset voltage, the testing chip outputs a testing fail signal to the control chip through the second I/O pin of the testing chip, the second I/O pin of the selecting chip, and the third I/O pin of the selecting chip, the control chip receives the testing fail signal and outputs a third signal to the fourth I/O pin of the selecting chip through the output pin of the control chip, the third I/O pin and the fifth I/O pin of the selecting chip are connected, the control chip controls the display device to display a testing result to show that the capacitor is unqualified.
1 Assignment
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Accused Products
Abstract
A serial advanced technology attachment dual in-line memory module device includes a capacitor to be tested, a control chip, a display device, a testing chip, and a selecting chip. Voltage pins of the testing chip and the selecting chip are connected to a power source. A testing pin of the testing chip is connected to the capacitor. A first input output (I/O) pin of the selecting chip is connected to a first I/O pin of the testing chip. A second I/O pin of the selecting chip is connected to a second I/O pin of the testing chip. A third I/O pin of the selecting chip is connected to an input pin of the control chip. A fourth I/O pin of the selecting chip is connected to an output pin of the control chip. A fifth I/O pin of the selecting chip is connected to the display device.
14 Citations
3 Claims
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1. A serial advanced technology attachment dual in-line memory module (SATA DIMM) device, comprising:
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a capacitor; a control chip; a display device; a testing chip storing a preset voltage, wherein a voltage pin of the testing chip is connected to a power source, a testing pin of the testing chip is connected to the capacitor; and a selecting chip, wherein a voltage pin of the selecting chip is connected to the power source, a first input output (I/O) pin of the selecting chip is connected to a first I/O pin of the testing chip, a second I/O pin of the selecting chip is connected to a second I/O pin of the testing chip, a third I/O pin of the selecting chip is connected to an input pin of the control chip, a fourth I/O pin of the selecting chip is connected to an output pin of the control chip, a fifth I/O pin of the selecting chip is connected to the display device; wherein when the SATA DIMM device is powered on, the control chip outputs a first signal to the fourth I/O pin of the selecting chip through the output pin of the control chip, the fourth I/O pin and the first I/O pin of the selecting chip are connected and output the first signal to the testing chip, the third I/O pin and the second I/O pin of the selecting chip are connected, the testing chip receives the first signal through the first I/O pin and measures a voltage of the capacitor through the testing pin and compares the measured voltage with the preset voltage, upon a condition that the testing voltage is equal to or greater than the preset voltage, the testing chip outputs a testing pass signal to the control chip through the second I/O pin of the testing chip, the second I/O pin of the selecting chip, and the third I/O pin of the selecting chip, the control chip receives the testing pass signal and outputs a second signal to the fourth I/O pin of the selecting chip through the output pin of the control chip, the third I/O pin of the selecting chip and the fifth I/O pin of the selecting chip are connected, the control chip controls the display device to display a testing result to show that the capacitor is qualified;
upon a condition that the measured voltage is less than the preset voltage, the testing chip outputs a testing fail signal to the control chip through the second I/O pin of the testing chip, the second I/O pin of the selecting chip, and the third I/O pin of the selecting chip, the control chip receives the testing fail signal and outputs a third signal to the fourth I/O pin of the selecting chip through the output pin of the control chip, the third I/O pin and the fifth I/O pin of the selecting chip are connected, the control chip controls the display device to display a testing result to show that the capacitor is unqualified. - View Dependent Claims (2, 3)
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Specification