ANALYZER OF ULTRASONIC FLAW DETECTION IMAGE

• US 20140098987A1
• Filed: 12/06/2013
• Published: 04/10/2014
• Est. Priority Date: 02/26/2009
• Status: Active Grant

• Current Assignee: Mitsubishi Heavy Industries, Ltd.
• Original Assignee: Mitsubishi Heavy Industries, Ltd.
• Inventors: KITAGAWA, Tomoaki, TAKEMOTO, Hiroshi
• Granted Patent: US 8,774,454 B2
• Time in Patent Office: Days
• US Class Current: 382/100
• CPC Class Codes: G01N 2291/2694 Wings or other aircraft parts
• CPC Class Codes: G01N 29/069 Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
• CPC Class Codes: G01N 29/4427 with stored values, e.g. threshold values
• CPC Class Codes: G06T 7/0008 checking presence/absence
• CPC Class Codes: G06T 7/001 using an image reference approach

Abstract

A flaw detection image analyzer (10) takes in an inspection procedure command stored in a flaw detection condition database (40), takes in a flaw detection image signal corresponding to a flaw detection image indicated by the taken inspection procedure command from a database (50) for flaw detection image signal, and displays the flaw detection image based on the flaw detection image signal on a display (30), with a display range and a contrast indicated by the inspection procedure command in an arrangement pattern of image indicated by the inspection procedure command. Consequently, optimum images can be displayed sequentially with optimum arrangement pattern, optimum display range and contrast according to a flaw to be inspected when a flaw is detected by observing an ultrasonic flaw detection image.

Claims

1-2. -2. (canceled)

3. An analytical apparatus for an ultrasonic flaw detection image, comprising:

a flaw detection image signal database division storing a plurality of flaw detection image signals obtained by signal transformation of an identical flaw detection waveform signal by a plurality of different signal transformation techniques;

a flaw detection condition database division storing a first flaw detection condition database constructed from many inspection procedure commands arranged in order of execution, the inspection procedure commands having, as information, a type of a defect to be inspected for, and a display range showing a range of an image region displayed among image regions of a flaw detection image used; and

a second flaw detection condition database defining the flaw detection image used, an arrangement pattern of the flaw detection image used, and contrast indicated values defining a contrast of an image in the display range, for each pattern comprising a combination of the type of the defect, a plate thickness, a shape, and a material;

a CAD model division having design data at least including data on a shape and a material of an object to be inspected;

a plate thickness measuring device for measuring a plate thickness of the object to be inspected; and

a flaw detection image analyzer,

wherein the flaw detection image analyzer

captures the inspection procedure commands of the first flaw detection condition database sequentially based on input commands from an outside,

whenever the inspection procedure command is captured, captures from the CAD model division the shape and material of a corresponding portion of the object to be inspected, which corresponds to the display range indicated by the captured inspection procedure command;

incorporates the captured shape and material into the inspection procedure command;

simultaneously captures the plate thickness measured by the plate thickness measuring device as a plate thickness of the corresponding portion of the object to be inspected, which corresponds to the display range indicated by the captured inspection procedure command; and

captures by reference to the second flaw detection condition database the flaw detection image used, the arrangement pattern of the flaw detection image used, and the contrast indicated values defining the contrast of the image in the display range, which are defined for the pattern comprising the combination of the type of the defect, and the plate thickness, the shape, and the material captured from the CAD model division and the plate thickness measuring device, and

captures from the flaw detection image signal database division the flaw detection image signal corresponding to the flaw detection image used, and allows a display device to display the flaw detection image based on the flaw detection image signal in the captured arrangement pattern of the image, in the captured display range, and with the captured contrast.