PROFILE MEASURING INSTRUMENT, ADJUSTING METHOD FOR PROFILE MEASURING INSTRUMENT, AND PROFILE MEASURING METHOD

• US 20140109419A1
• Filed: 10/16/2013
• Published: 04/24/2014
• Est. Priority Date: 10/18/2012
• Status: Active Grant

• Current Assignee: Mitutoyo Corporation
• Original Assignee: Mitutoyo Corporation
• Inventors: Shindo, Hideki, Omori, Yoshiyuki
• Granted Patent: US 9,316,476 B2
• Time in Patent Office: Days
• US Class Current: 33/502
• CPC Class Codes: G01B 5/008 using coordinate measuring machines
• CPC Class Codes: G01B 5/20 for measuring contours or curvatures
• CPC Class Codes: G01B 5/201 for measuring roundness

Abstract

A profile measuring instrument usable to perform a rotary scanning measurement and a linear scanning measurement on a workpiece in the form of a revolution solid, includes: a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis; a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable; a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis. The linear scanning measurement unit and the turntable are adjusted to relative positions at which the measurement axis passes through the rotation axis.

Claims

1. A profile measuring instrument usable to perform a rotary scanning measurement and a linear scanning measurement on a workpiece in a form of a revolution solid, comprising:

a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis;

a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable;

a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and

an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis, wherein

the linear scanning measurement unit and the turntable are adjusted to relative positions at which the measurement axis passes through the rotation axis.

2. An adjusting method for a profile measuring instrument being usable to perform a rotary scanning measurement and a linear scanning measurement on a workpiece in a form of a revolution solid and comprising:

a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis;

a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable;

a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and

an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis, the adjusting method allowing adjustment of the linear scanning measurement unit and the turntable to relative positions at which the measurement axis passes through the rotation axis, the adjusting method comprising;

mounting a calibration workpiece on the turntable;

performing a centering process comprising;

performing the rotary scanning measurement on the calibration workpiece mounted on the turntable using the rotary scanning measurement unit; and

adjusting a position and a posture of the calibration workpiece relative to the turntable such that a center axis of the calibration workpiece is aligned with the rotation axis of the turntable; and

performing an aligning process comprising;

performing the linear scanning measurement on the calibration workpiece using the linear scanning measurement unit after the position of the calibration workpiece is adjusted; and

adjusting the position of the calibration workpiece relative to the turntable using the aligning mechanism such that the measurement axis of the linear scanning measurement unit passes through the center axis of the calibration workpiece.

3. A profile measuring method for performing a rotary scanning measurement and a linear scanning measurement on a workpiece in a form of a revolution solid, implemented using a profile measuring instrument comprising:

a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis;

a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable;

a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and

an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis, the profile measuring method comprising;

positionally adjusting the linear scanning measurement unit and the turntable to relative positions at which the measurement axis passes through the rotation axis in advance;

mounting the workpiece on the turntable;

performing a centering process comprising;

performing the rotary scanning measurement on the workpiece mounted on the turntable using the rotary scanning measurement unit; and

adjusting a position and a posture of the workpiece relative to the turntable such that a center axis of the workpiece is aligned with the rotation axis of the turntable; and

performing the rotary scanning measurement and the linear scanning measurement on the workpiece using the rotary scanning measurement unit and the linear scanning measurement unit, respectively, after the position and the posture of the workpiece are adjusted.