TRANSLATING BETWEEN TESTING REQUIREMENTS AT DIFFERENT REFERENCE POINTS

• US 20140128006A1
• Filed: 11/02/2012
• Published: 05/08/2014
• Est. Priority Date: 11/02/2012
• Status: Active Grant

• Current Assignee: WSOU Investments, LLC (WSOU Holdings, LLC)
• Original Assignee: Alcatel-Lucent USA, Inc. (Nokia Corporation)
• Inventors: Hu, Teck
• Granted Patent: US 9,088,356 B2
• Time in Patent Office: Days
• US Class Current: 455/73
• CPC Class Codes: H04B 17/104 of other parameters, e.g. DC offset, delay or propagation times
• CPC Class Codes: H04B 17/15 Performance testing

Abstract

Embodiments of the claimed subject matter provide a method and apparatus for translating testing requirements between different reference points. Some embodiments of the method include generating mapping information that relates at least one first requirement associated with an active antenna array to at least one second requirement associated with the active antenna array. The first requirements are associated with a first reference point and the second requirements are associated with a second reference point that differs from the first reference point. Some embodiments of the method also include storing the mapping information in a non-transitory computer-readable storage media.

Claims

1. A method, comprising:

generating mapping information that relates at least one first requirement associated with an active antenna array to at least one second requirement associated with the active antenna array, wherein said at least one first requirement is associated with a first reference point and said at least one second requirement is associated with a second reference point that differs from the first reference point; and

storing said mapping information in a non-transitory computer-readable storage media.

2. The method of claim 1, wherein said at least one first requirement comprises a first threshold value of an adjacent channel leakage ratio associated with an antenna connection point between baseband circuitry and the active antenna array.

3. The method of claim 2, wherein said at least one second requirement comprises a second threshold value of the adjacent channel leakage ratio associated with a far-field reference point.

4. The method of claim 2, wherein said at least one second requirement comprises a plurality of second threshold values of the adjacent channel leakage ratio associated with a plurality of far-field reference points associated with different angles-of-arrival at the active antenna array.

5. The method of claim 1, wherein generating the mapping information comprises generating the mapping information based on a correlation parameter associated with the active antenna array and at least one predetermined value of at least one of the first requirement or the second requirement.

6. The method of claim 5, wherein the correlation parameter varies from a value of 1.0 when antenna elements in the active antenna array are fully correlated and a value of 0 when antenna elements in the active antenna array are uncorrelated.

7. The method of claim 1, comprising translating at least one measured value of at least one requirement using the mapping table, wherein said at least one measured value is measured at one of the first and second reference points and the translated value of said at least one measured value corresponds to the other one of the first and second reference points.

8. A method, comprising:

accessing information indicating at least one first requirement associated with an active antenna array, said at least one first requirement being associated with a first reference point;

determining at least one second requirement associated with the active antenna array based on measurements performed at a second reference point different than the first reference point; and

translating said at least one second requirement to correspond to at least one value associated with the first reference point, wherein said translation is performed using mapping information that relates requirements associated with the first reference point and requirements associated with the second reference point.

9. The method of claim 8, wherein said at least one first requirement comprises a first threshold value of an adjacent channel leakage ratio applied at an antenna connection point between baseband circuitry and the active antenna array.

10. The method of claim 9, wherein said at least one second requirement comprises a value of the adjacent channel leakage ratio determined based on measurements performed at a far-field reference point.

11. The method of claim 9, wherein said at least one second requirement comprises a plurality of values of the adjacent channel leakage ratio determined based on measurements performed at a plurality of far-field reference points associated with different angles-of-arrival at the active antenna array.

12. The method of claim 8, wherein the mapping information is generated based on a correlation parameter associated with the active antenna array and at least one predetermined value of at least one of the first requirement or the second requirement.

13. The method of claim 12, wherein the correlation parameter varies from a value of 1.0 when antenna elements in the active antenna array are fully correlated and a value of 0 when antenna elements in the active antenna array are uncorrelated.

14. The method of claim 8, comprising comparing the translated values of said at least one second requirement to values of said at least one first requirement.

15. An apparatus, comprising:

a translator configurable to;

access information indicating at least one first requirement associated with an active antenna array, said at least one first requirement being associated with a first reference point;

access information indicating at least one second requirement associated with the active antenna array, wherein said at least one second requirement is determined based on measurements performed at a second reference point different than the first reference point; and

translate said at least one second requirement to correspond to at least one value associated with the first reference point, wherein said translation is performed using mapping information that relates requirements associated with the first reference point and requirements associated with the second reference point.

16. The apparatus of claim 15, wherein said at least one first requirement comprises a first threshold value of an adjacent channel leakage ratio applied at an antenna connection point between baseband circuitry and the active antenna array.

17. The apparatus of claim 16, wherein said at least one second requirement comprises a value of the adjacent channel leakage ratio determined based on measurements performed at a far-field reference point.

18. The apparatus of claim 16, wherein said at least one second requirement comprises a plurality of values of the adjacent channel leakage ratio determined based on measurements performed at a plurality of far-field reference points associated with different angles-of-arrival at the active antenna array.

19. The apparatus of claim 15, comprising a reference point mapping table configurable to store mapping information is generated based on a correlation parameter associated with the active antenna array and at least one predetermined value of at least one of the first requirement or the second requirement, and wherein the translator is configurable to access the mapping information stored in the reference point mapping table.

20. The apparatus of claim 19, wherein the correlation parameter varies from a value of 1.0 when antenna elements in the active antenna array are fully correlated and a value of 0 when antenna elements in the active antenna array are uncorrelated.

21. The apparatus of claim 15, comprising a comparator configurable to compare the translated values of said at least one second requirement to values of said at least one first requirement.