DEBUGGING IN A SEMICONDUCTOR DEVICE TEST ENVIRONMENT
First Claim
1. At least one computer-readable storage medium comprising computer-executable instructions that, when executed on at least one processor of a computing device, implement a debug method comprising:
- interactively receive debug inputs from a user of the computing device;
access a test program, the test program comprising a plurality of test program commands;
generate instrument commands configured to control instruments of a tester to stimulate a device under test (DUT) and receive responses from the DUT in accordance with the debug inputs and the test program commands; and
apply the instrument commands to instruments in the tester.
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Accused Products
Abstract
A test system that enables real-time interactive debugging of a device under test (DUT) using native customer code. A translation module may format, in real time, debug commands, corresponding to a user input, into a format recognizable by instruments in a tester. The user input may be a test program or test instructions written in a high-level programming language. The translation module may translate the user'"'"'s debug commands into lower-level test instrument commands, based on which the tester may apply control signals to a processor in the DUT to test subsystems of the DUT. A result of the test may be provided to the translation module, which may, in real time, format another debug command, or provide an indication of the result to the user. The translation module may thus enable a user to step-through and modify native customer code in an interactive manner to debug a DUT.
58 Citations
27 Claims
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1. At least one computer-readable storage medium comprising computer-executable instructions that, when executed on at least one processor of a computing device, implement a debug method comprising:
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interactively receive debug inputs from a user of the computing device; access a test program, the test program comprising a plurality of test program commands; generate instrument commands configured to control instruments of a tester to stimulate a device under test (DUT) and receive responses from the DUT in accordance with the debug inputs and the test program commands; and apply the instrument commands to instruments in the tester. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method of operating a test system, the method comprising:
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with at least one debug tool, receiving user input and, in response to the user input, generating a plurality of debug commands; receiving the plurality of debug commands at an interface; within the interface, formatting, in real time, the plurality of debug commands for application to a test system; applying the formatted commands to the test system; and within the test system, controlling one or more instruments to stimulate a device under test and measure responses of the device under test in accordance with the plurality of debug commands and protocol information associated with a device under test. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A test apparatus comprising:
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a plurality of instruments disposed within a tester, each of the instruments configured to generate and/or measure at least one signal for application to a device under test; and at least one processor configured to implement; a debugger module, the debugger module comprising an interface, wherein the debugger module is configured to execute at least one debug tool in response to information received through the interface to generate debug commands; a tester control module, the tester control module comprising an input, wherein the tester control module is configured to generate, in real time, control signals that control the plurality of instruments to generate and/or measure signals for application to the device under test based on instrument commands received through the input; and a translation module coupled between the debugger module and the tester control module, wherein the translation module is configured to; receive a first set of debug commands from the debugger module; generate, based on the first set, a second set of instrument commands; and apply the second set to the input of the tester control module in real time in relation to receipt of the first set of debug commands. - View Dependent Claims (23, 24, 25, 26, 27)
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Specification