SYSTEMS AND METHODS FOR FRACTURE DETECTION IN AN INTEGRATED CIRCUIT
First Claim
1. A method comprising:
- obtaining a measurement of a property of an integrated circuit through at least one contact of the integrated circuit, wherein the measurement comprises a measurement of a resistance of a resistive pattern in the integrated circuit or a measurement of current-voltage behavior of a power supply of the integrated circuit;
comparing the measurement of the property to an expected baseline property; and
determining whether a fracture of the integrated circuit has occurred and a location of the fracture in the integrated circuit based at least in part on the comparison.
1 Assignment
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Accused Products
Abstract
Systems, methods, and devices are provided to identify the occurrence, location, and/or severity of a fracture within an integrated circuit, even when the integrated circuit is not accessible to external inspection. One such method includes obtaining a measurement of a property of the integrated circuit through at least one contact of the integrated circuit. The measurement may include a resistance of a resistive pattern in the integrated circuit or a measurement of current-voltage behavior of a power supply of the integrated circuit. The measurement of the property may be compared to an expected baseline property. Based at least in part on this comparison, whether a fracture of the integrated circuit has occurred and a location of the fracture in the integrated circuit may be determined.
4 Citations
34 Claims
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1. A method comprising:
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obtaining a measurement of a property of an integrated circuit through at least one contact of the integrated circuit, wherein the measurement comprises a measurement of a resistance of a resistive pattern in the integrated circuit or a measurement of current-voltage behavior of a power supply of the integrated circuit; comparing the measurement of the property to an expected baseline property; and determining whether a fracture of the integrated circuit has occurred and a location of the fracture in the integrated circuit based at least in part on the comparison. - View Dependent Claims (2, 3, 4, 5, 6)
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7. One or more articles of manufacture comprising a non-transitory machine-readable media storing instructions to:
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(a) receive a measurement of a behavior of a component of a display driver of an electronic display of an electronic device; and (b) determine a location of a fracture in the display driver when the fracture has occurred based at least in part on the measurement of the behavior. - View Dependent Claims (8, 9, 10, 11, 12)
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13. An electronic device comprising:
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a processor configured to generate image data; and an electronic display configured to display the image data, wherein the electronic display comprises; a display panel; display driver circuitry configured to program the image data on the display panel, wherein the display driver circuitry comprises a first component whose behavior is configured to vary based at least in part on whether a fracture has occurred in the display driver circuitry; and measurement circuitry configured to perform a measurement of the behavior of the first component of the display driver circuitry; wherein the processor or the electronic display comprises fracture analysis logic configured to configured to determine, based at least in part on the measurement of the behavior of the first component of the display driver circuitry; whether the fracture has occurred; and when the fracture has occurred, a region of the display driver circuitry where the fracture has occurred. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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21. A method comprising:
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measuring current-voltage behavior of a plurality of power supply connections of an integrated circuit; comparing the measured current-voltage behavior of the plurality of power supply connections to respective baseline current-voltage behavior of the plurality of power supply connections; and identifying whether a fracture has occurred in the integrated circuit based at least in part on the comparison. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28)
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29. A method comprising:
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providing an electronic display, wherein the electronic display comprises display driver circuitry inaccessible to external inspection; measuring a behavior of the display driver circuitry to obtain a first measurement of the behavior of the display driver circuitry; detecting whether a fracture has occurred in the display driver circuitry based at least in part on the first measurement of the behavior of the display driver circuitry; and when the fracture is detected to have occurred in the display driver circuitry, detecting a region of the display driver circuitry where the fracture has occurred based at least in part on the first measurement of the behavior of the display driver circuitry. - View Dependent Claims (30, 31, 32, 33, 34)
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Specification