Methods for Validating Radio-Frequency Test Systems Using Statistical Weights

• US 20140162628A1
• Filed: 12/07/2012
• Published: 06/12/2014
• Est. Priority Date: 12/07/2012
• Status: Abandoned Application

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Bevelacqua, Peter, Nath, Jayesh, Schlub, Robert W., Pascolini, Mattia
• Application Number:
  US13/708,792
• Publication Number:
  US 20140162628A1
• Time in Patent Office: Days
• US Class Current: 455/423
• CPC Class Codes: H04B 17/15 Performance testing
• CPC Class Codes: H04B 17/26 using historical data, averaging values or statistics

Abstract

A test system may include test stations for testing the radio-frequency performance of wireless electronic devices. A reference test station may perform test measurements on a group of wireless electronic devices under test (DUTs) to select a reference DUT. The reference test station may gather radio-frequency measurements at a number of test frequencies from the group of DUTs. The reference test station may compute statistical data associated with the gathered measurements. The reference test station may compute weight values associated with each test frequency based on the statistical parameters. The reference test station may compute a weighted mean square error value for each DUT based on the weight values and the statistical data. The reference test station may select a DUT having a minimum weighted mean square error value to serve as the reference DUT, which may be used to calibrate test stations in the test system.

Claims

1. A method of using a test system, comprising:

with the test system, gathering test data by testing a plurality of electronic devices under test at desired frequencies; and

with the test system, weighting the test data at each of the desired frequencies using a respective predetermined factor.

2. The method defined in claim 1, further comprising:

with the test system, computing a respective standard deviation value for the test data at each of the desired frequencies.

3. The method defined in claim 2, wherein weighting the test data comprises weighting the test data based on the computed standard deviation value at each of the desired frequencies.

4. The method defined in claim 3, wherein the predetermined factor at each of the desired frequencies is directly proportional to the computed standard deviation value at each of the desired frequencies.

5. The method defined in claim 1, further comprising:

with the test system, identifying a respective range of acceptable test data values for the test data at each of the desired frequencies.

6. The method defined in claim 5, wherein weighting the test data comprises:

weighting the test data based on the identified range of acceptable test data values at each of the desired frequencies.

7. The method defined in claim 6, wherein the predetermined factor at each of the desired frequencies is inversely proportional to the identified range of acceptable test data values at each of the desired frequencies.

8. The method defined in claim 5, further comprising:

with the test system, computing a respective standard deviation value for the test data at each of the desired frequencies.

9. The method defined in claim 8, wherein weighting the test data comprises:

weighting the test data based on the computed standard deviation value and identified range of acceptable test data values at each of the desired frequencies.

10. The method defined in claim 8, wherein the predetermined factor at each of the desired frequencies is directly proportional to the computed standard deviation value and inversely proportional to the identified range of acceptable test data values.

11. The method defined in claim 1, wherein the test data comprises performance metric data associated with radio-frequency performance of the electronic devices under test, wherein gathering the test data comprises:

gathering the performance metric data from the plurality of electronic devices under test at the desired frequencies.

12. The method defined in claim 1, further comprising:

with the test system, computing respective statistical parameters for the test data at each of the desired frequencies; and

with the test system, computing the predetermined factors based on the statistical parameters at each of the desired frequencies.

13. The method defined in claim 12, wherein weighting the test data comprises:

using the predetermined factors to compute a weighted mean square error value for each electronic device under test of the plurality of electronic devices under test.

14. The method defined in claim 13, further comprising:

with the test system, computing a respective average value for the test data at each of the desired frequencies, wherein computing the weighted mean square error value comprises computing the weighted mean square error value for each electronic device under test in the plurality of electronic devices under test using the predetermined factors and the computed average values.

15. The method defined in claim 14, further comprising:

identifying an electronic device under test from the plurality electronic devices under test having a minimum computed weighted mean square error value as a reference electronic device under test.

16. A method of using a test system, comprising:

with the test system, gathering test data by testing a plurality of electronic devices under test at desired frequencies;

computing an error value for each of the plurality of electronic devices under test by weighting the gathered data using predetermined factors; and

selecting a reference electronic device under test from the plurality of electronic devices under test based on the computed error value for each of the plurality of electronic devices under test.

17. The method defined in claim 16, wherein the predetermined factors each comprise a respective standard deviation value for the test data at each of the desired frequencies.

18. The method defined in claim 17, wherein computing the error value comprises computing a weighted mean square error value for each of the plurality of electronic devices under test using the standard deviation values at each of the desired frequencies.

19. The method defined in claim 18, wherein selecting the reference electronic device under test comprises identifying an electronic device under test having a minimum computed weighted mean square error value as the reference electronic device under test.

20. The method defined in claim 17, further comprising:

computing a respective mean value for the test data at each of the desired frequencies, wherein computing the error value comprises computing a weighted mean square error value for each of the plurality of electronic devices under test using the standard deviation values and the mean values at each of the desired frequencies.

21. The method defined in claim 19, wherein the test system comprises at least one test station for testing radio-frequency performance of the plurality of electronic devices under test, the method further comprising:

with the reference electronic device under test, calibrating the at least one test station.

22. A test system for testing a plurality of wireless electronic devices, comprising:

test equipment operable to gather radio-frequency test data from the plurality of wireless electronic devices at desired frequencies, wherein;

the test equipment is configured to compute a respective weight value for the test data at each of the desired frequencies;

the test equipment is configured to compute a respective weighted error value for each of the plurality of wireless electronic devices using the computed weight values; and

the test equipment is configured to select a reference wireless electronic device from the plurality of wireless electronic devices based on the weighted error values.

23. The test system defined in claim 22, wherein the test equipment is configured to compute the weight values based on a respective standard deviation value for the test data at each of the desired frequencies.

24. The test system defined in claim 23, wherein the test equipment is configured to compute weight values that are directly proportional to the standard deviation value at each of the desired frequencies.

25. The test system defined in claim 22, wherein the test equipment is configured to compute the weight values based on a respective range of acceptable test data values and a respective standard deviation value for the test data at each of the desired frequencies.

26. The test system defined in claim 25, wherein the test equipment is configured to compute weight values that are directly proportional to the standard value and inversely proportional to the range of acceptable test data values at each of the desired frequencies.

27. The test system defined in claim 22, wherein the test equipment is configured to select a reference wireless electronic device from the plurality of wireless electronic devices having a minimum weighted error value.