Methods for Validating Radio-Frequency Test Systems Using Statistical Weights
First Claim
1. A method of using a test system, comprising:
- with the test system, gathering test data by testing a plurality of electronic devices under test at desired frequencies; and
with the test system, weighting the test data at each of the desired frequencies using a respective predetermined factor.
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Abstract
A test system may include test stations for testing the radio-frequency performance of wireless electronic devices. A reference test station may perform test measurements on a group of wireless electronic devices under test (DUTs) to select a reference DUT. The reference test station may gather radio-frequency measurements at a number of test frequencies from the group of DUTs. The reference test station may compute statistical data associated with the gathered measurements. The reference test station may compute weight values associated with each test frequency based on the statistical parameters. The reference test station may compute a weighted mean square error value for each DUT based on the weight values and the statistical data. The reference test station may select a DUT having a minimum weighted mean square error value to serve as the reference DUT, which may be used to calibrate test stations in the test system.
83 Citations
27 Claims
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1. A method of using a test system, comprising:
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with the test system, gathering test data by testing a plurality of electronic devices under test at desired frequencies; and with the test system, weighting the test data at each of the desired frequencies using a respective predetermined factor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A method of using a test system, comprising:
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with the test system, gathering test data by testing a plurality of electronic devices under test at desired frequencies; computing an error value for each of the plurality of electronic devices under test by weighting the gathered data using predetermined factors; and selecting a reference electronic device under test from the plurality of electronic devices under test based on the computed error value for each of the plurality of electronic devices under test. - View Dependent Claims (17, 18, 19, 20, 21)
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22. A test system for testing a plurality of wireless electronic devices, comprising:
test equipment operable to gather radio-frequency test data from the plurality of wireless electronic devices at desired frequencies, wherein; the test equipment is configured to compute a respective weight value for the test data at each of the desired frequencies; the test equipment is configured to compute a respective weighted error value for each of the plurality of wireless electronic devices using the computed weight values; and the test equipment is configured to select a reference wireless electronic device from the plurality of wireless electronic devices based on the weighted error values. - View Dependent Claims (23, 24, 25, 26, 27)
Specification