Continuous-Scanning Image Acquisition in Automated Microscopy Using Reflective Autofocus

• US 20140168402A1
• Filed: 12/13/2012
• Published: 06/19/2014
• Est. Priority Date: 12/13/2012
• Status: Abandoned Application

• Current Assignee: Vala Sciences, Inc.
• Original Assignee: Vala Sciences, Inc.
• Inventors: Fuller, Derek N., Azimi, Behrad, Gemmen, Gregory J.
• Application Number:
  US13/714,292
• Publication Number:
  US 20140168402A1
• Time in Patent Office: Days
• US Class Current: 348/79
• CPC Class Codes: G02B 21/244 using image analysis techniques
• CPC Class Codes: G02B 21/361 Optical details, e.g. image relay to the camera or image sensor G02B21/364 takes precedence; illumination details G02B21/06 and subgroups
• CPC Class Codes: G02B 21/365 Control or image processing arrangements for digital or video microscopes G02B21/361, G02B21/362 take precedence

Abstract

Continuous-scanning image acquisition in an automated microscopy system uses an image reflected off of an object that supports a specimen being imaged to automatically focus the microscopy system.

Claims

1. An automated microscopy system, comprising:

a continuous-scanning image acquisition unit; and

,

a reflective positioning unit to automatically focus the automated microscopy system during scanning.

2. The automated microscopy system of claim 1 in which the continuous-scanning image acquisition unit is a time-delay-and-integration image acquisition unit.

3. The automated microscopy system of claim 1 in which the reflective positioning unit automatically focuses the automated microscopy system in response to reflection of an optical image from a surface or a layer of an object on which a specimen imaged by the continuous-scanning image acquisition unit is mounted.

4. The automated microscopy system of claim 3 in which the continuous-scanning image acquisition unit is a time-delay-and-integration image acquisition unit.

5. The automated microscopy system of claim 1 in which the continuous-scanning image acquisition unit acquires images at a magnification of 10×

.

6. A method of operating an automated microscopy system, comprising:

acquiring images of a specimen by a continuous-scanning method; and

,

automatically focusing the automated microscopy system during scanning by a reflective positioning method.

7. The method of claim 6 in which acquiring images of a specimen includes time-delay-and-integration image acquisition.

8. The method of claim 6 in which automatically focusing the automated microscopy system includes automatically focusing in response to reflection of an optical image from a surface or a layer of an object on which a specimen imaged by the continuous-scanning image acquisition unit is mounted.

9. The method of claim 8 in which acquiring images of a specimen includes time-delay-and-integration image acquisition.

10. The method of claim 6 in which acquiring images includes acquiring images at a magnification of 10×

.