×

METHODS OF ANALYSING APPARATUS

  • US 20140180606A1
  • Filed: 07/05/2013
  • Published: 06/26/2014
  • Est. Priority Date: 12/21/2005
  • Status: Active Grant
First Claim
Patent Images

1. A method for determining an artifact in a component comprising the steps:

  • a) exciting the component to induce a resonance response;

    b) calculating the real and imaginary components of bi-coherence b of a resonance response at pk0 and qk0 wherein p and q are integers and k0 is the component resonant frequency; and

    c) determining a location of a point related to calculated components in real and imaginary two-dimensional space, the location of the point determining the presence of an artifact.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×