MEASUREMENT APPARATUS AND MEASUREMENT METHOD
First Claim
1. A measurement apparatus for measuring a shape of an object to be measured, comprising:
- a measuring head configured to perform measurement in a first measurement mode, and perform measurement in a second measurement mode having measurement accuracy higher than that of the first measurement mode;
a detection unit configured to detect an occupancy region of the object to be measured; and
a control unit configured to control the measuring head,wherein in the first measurement mode, the control unit moves, based on a detection result of the detection unit, the measuring head not to touch the object to be measured, andin the second measurement mode, the control unit moves, based on a measurement result in the first measurement mode, the measuring head to satisfy an allowable condition in the second measurement mode.
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Abstract
The present invention provides a measurement apparatus for measuring a shape of an object to be measured, comprising a measuring head configured to perform measurement in a first measurement mode and perform measurement in a second measurement mode having measurement accuracy higher than that of the first measurement mode, a detection unit configured to detect an occupancy region of the object to be measured, and a control unit configured to control the measuring head, wherein in the first measurement mode, the control unit moves, based on a detection result of the detection unit, the measuring head not to touch the object to be measured, and in the second measurement mode, the control unit moves, based on a measurement result in the first measurement mode, the measuring head to satisfy an allowable condition in the second measurement mode.
15 Citations
12 Claims
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1. A measurement apparatus for measuring a shape of an object to be measured, comprising:
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a measuring head configured to perform measurement in a first measurement mode, and perform measurement in a second measurement mode having measurement accuracy higher than that of the first measurement mode; a detection unit configured to detect an occupancy region of the object to be measured; and a control unit configured to control the measuring head, wherein in the first measurement mode, the control unit moves, based on a detection result of the detection unit, the measuring head not to touch the object to be measured, and in the second measurement mode, the control unit moves, based on a measurement result in the first measurement mode, the measuring head to satisfy an allowable condition in the second measurement mode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A measurement apparatus for measuring a shape of an object to be measured, comprising:
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a measuring head configured to perform measurement in a first measurement mode, and perform measurement in a second measurement mode having measurement accuracy higher than that of the first measurement mode; and a control unit configured to control the measuring head, wherein in the first measurement mode, the control unit moves the measuring head outside an allowable region within which the object to be measured should fall while the object to be measured falls within the allowable region, and in the second measurement mode, the control unit moves, based on a measurement result in the first measurement mode, the measuring head to satisfy an allowable condition in the second measurement mode.
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12. A measurement method of measuring a shape of an object to be measured by using a measuring head to perform measurement in a first measurement mode and perform measurement in a second measurement mode having measurement accuracy higher than that of the first measurement mode, the method comprising:
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detecting an occupancy region of the object to be measured; moving, in the first measurement mode, based on a result of the detecting, the measuring head not to contact the object to be measured; and moving, in the second measurement mode, based on a measurement result in the first measurement mode, the measuring head to satisfy an allowable condition in the second measurement mode.
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Specification