MAINTENANCE PREDICTION OF ELECTRONIC DEVICES USING PERIODIC THERMAL EVALUATION

• US 20140188434A1
• Filed: 12/27/2012
• Published: 07/03/2014
• Est. Priority Date: 12/27/2012
• Status: Active Grant

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Steinbrecher, Robin A., Ahuja, Nishi, Ahuja, Sandeep
• Granted Patent: US 10,667,438 B2
• Time in Patent Office: Days
• US Class Current: 702/184
• CPC Class Codes: G05B 23/0283 Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL] preventive maintenance, i.e. planning maintenance according to the available resources without monitoring the system G06Q10/06
• CPC Class Codes: H05K 7/20836 Thermal management, e.g. server temperature control

Abstract

A method for determining whether to perform maintenance for an electronic device includes generating a baseline characterization of thermal performance for a heat-generating component of the electronic device at a baseline date. The method also includes generating an assessment characterization of the thermal performance at an assessment date after the baseline date. The method further includes generating a historical trend that includes the baseline characterization and the assessment characterization. Additionally, the method includes determining whether to perform maintenance for the heat-generating component based on the historical trend and a specified maintenance parameter.

Claims

1. A method for determining whether to perform maintenance for an electronic device, comprising:

generating a baseline characterization of thermal performance for a heat-generating component of the electronic device at a baseline date;

generating an assessment characterization of the thermal performance at an assessment date after the baseline date;

generating a historical trend for the heat-generating component, comprising the baseline characterization and the assessment characterization; and

determining whether to perform maintenance for the heat-generating component based on the historical trend and a specified maintenance parameter.

2. The method of claim 1, wherein generating the historical trend comprises:

determining an assessment parameter values as a function of assessment dates for a plurality of assessments comprising the assessment characterization; and

determining a trend for each of the assessment parameter values.

3. The method of claim 1, wherein generating the baseline characterization comprises:

running a constant power benchmark; and

determining an inlet temperature of a system comprising the heat-generating component;

determining an operating temperature of the heat-generating component; and

determining a power consumption of the heat-generating component.

4. The method of claim 3, wherein generating the baseline characterization comprises determining fan speed.

5. The method of claim 1, comprising issuing a maintenance alert if the time is before a next scheduled assessment of the heat-generating component.

6. The method of claim 5, comprising:

determining a period of time until the specified maintenance parameter is exceeded;

presenting a report comprising;

the average increase; and

the period of time.

7. The method of claim 1, comprising:

performing an additional assessment characterization after removing dust from the heat-generating component; and

determining that a thermal interface material is to be replaced.

8. The method of claim 7, wherein the thermal interface material comprises thermal interface material 2.

9. A system, comprising:

a processor; and

a memory comprising computer-executable instructions configured to cause the processor to;

generate a baseline characterization of thermal performance for a heat-generating component of the electronic device at a baseline date;

generate an assessment characterization of the thermal performance at an assessment date after the baseline date;

generate a historical trend for the heat-generating component comprising the baseline characterization and the assessment characterization; and

determine whether to perform maintenance for the heat-generating component based on the historical trend and a specified maintenance parameter.

10. The system of claim 9, wherein generating the baseline characterization comprises:

running a constant power benchmark; and

determining an inlet temperature of the heat-generating component;

determining an operating temperature of the heat-generating component; and

determining a power consumption of the heat-generating component.

11. The system of claim 10, wherein generating the baseline characterization comprises determining fan speed.

12. The system of claim 9, comprising code configured to cause the processor to determine an average increase in power consumption between the baseline date and the assessment date.

13. The system of claim 12, comprising code configured to cause the processor to determine a period of time until the specified maintenance parameter is met.

14. The system of claim 13, comprising code configured to cause the processor to present a report comprising:

the average increase; and

the period of time.

15. The system of claim 9, comprising code configured to cause the processor to:

perform an additional assessment characterization after removing dust from the heat-generating component; and

determine that a thermal interface material is to be replaced.

16. The system of claim 15, wherein the thermal interface material comprises thermal interface material 2.

17. A computer-readable medium, comprising code configured to cause a processor to:

generate a baseline characterization of thermal performance for a heat-generating component of the electronic device at a baseline date;

generate an assessment characterization of the thermal performance at an assessment date after the baseline date;

generate a historical trend for the heat-generating component, comprising the baseline characterization and the assessment characterization;

determine a time when the heat-generating component is performing outside a specified maintenance parameter based on the historical trend;

determine whether to perform maintenance for the heat-generating component based on the time; and

generate a report indicating the time and the historical trend.

18. The computer-readable medium of claim 17, wherein generating the assessment characterization comprises:

running a constant power benchmark; and

determining an inlet temperature of the heat-generating component;

determining an operating temperature of the heat-generating component; and

determining a power consumption of the heat-generating component.

19. The computer-readable medium of claim 17, wherein generating the baseline characterization comprises determining fan speed.

20. The computer-readable medium of claim 17, comprising code configured to cause the processor to determine an average increase in power consumption between the baseline date and the assessment date.

21. The computer-readable medium of claim 20, comprising code configured to issue a maintenance alert if the time is before a next scheduled assessment of the heat-generating component.

22. The computer-readable medium of claim 21, comprising code configured to cause the processor to present a report comprising:

the average increase; and

the period of time.

23. An electronic device, comprising:

logic to generate a baseline characterization of thermal performance for a heat-generating component of the electronic device at a baseline date;

logic to generate an assessment characterization of the thermal performance at an assessment date after the baseline date;

logic to generate a historical trend for the heat-generating component, comprising the baseline characterization and the assessment characterization; and

logic to determine whether to perform maintenance for the heat-generating component based on the historical trend and a specified maintenance parameter.

24. The electronic device of claim 23, wherein the logic to generate the historical trend comprises:

logic to determine an assessment parameter values as a function of assessment dates for a plurality of assessments comprising the assessment characterization; and

logic to determine a trend for each of the assessment parameter values.

25. The electronic device of claim 23, wherein the logic to generate the baseline characterization comprises:

logic to run a constant power benchmark; and

logic to determine an inlet temperature of a system comprising the heat-generating component;

logic to determine an operating temperature of the heat-generating component; and

logic to determine a power consumption of the heat-generating component.

26. The electronic device of claim 25, wherein the logic to generate the baseline characterization comprises logic to determine fan speed.

27. The electronic device of claim 23, comprising logic to issue a maintenance alert if the time is before a next scheduled assessment of the heat-generating component.

28. The electronic device of claim 27, comprising:

logic to determine a period of time until the specified maintenance parameter is exceeded;

logic to present a report comprising;

the average increase; and

the period of time.

29. The electronic device of claim 23, comprising:

logic to perform an additional assessment characterization after removing dust from the heat-generating component; and

logic to determine that a thermal interface material is to be replaced.

30. The electronic device of claim 29, wherein the thermal interface material comprises thermal interface material 2.