CROSSTALK SUPPRESSION IN WIRELESS TESTING OF SEMICONDUCTOR DEVICES
1 Assignment
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Accused Products
Abstract
An integrated circuit integrated on a semiconductor material die and adapted to be at least partly tested wirelessly, wherein circuitry for setting a selected radio communication frequencies to be used for the wireless test of the integrated circuit are integrated on the semiconductor material die.
1 Citation
19 Claims
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1-12. -12. (canceled)
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13. An apparatus, comprising:
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a wireless probe card having a plurality of wireless units, the plurality of wireless units including at least a first wireless unit and a second wireless unit, wherein the first wireless unit is configured to wirelessly communicate with a first integrated circuit die at a first frequency, and wherein the second wireless unit is configured to wirelessly communicate with a second integrated circuit die at a second frequency different than the first frequency. - View Dependent Claims (14, 15, 16, 17, 18, 19)
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Specification