MINIATURE TUNABLE LASER SPECTROMETER FOR DETECTION OF A TRACE GAS

• US 20140204382A1
• Filed: 01/23/2014
• Published: 07/24/2014
• Est. Priority Date: 01/23/2013
• Status: Active Grant

• Current Assignee: California Institute of Technology
• Original Assignee: California Institute of Technology
• Inventors: Christensen, Lance E.
• Granted Patent: US 9,671,332 B2
• Time in Patent Office: Days
• US Class Current: 356/402
• CPC Class Codes: G01N 2021/3513 Open path with an instrumental source
• CPC Class Codes: G01N 2021/399 Diode laser
• CPC Class Codes: G01N 21/031 Multipass arrangements
• CPC Class Codes: G01N 21/3504 for analysing gases, e.g. multi-gas analysis
• CPC Class Codes: G01N 21/39 using tunable lasers
• CPC Class Codes: G01N 2201/0221 Portable; cableless; compact; hand-held

Abstract

An open-path laser spectrometer (OPLS) for measuring a concentration of a trace gas, the OPLS including an open-path multi-pass analysis region including a first mirror, a second mirror at a distance and orientation from the first mirror, and a support structure for locating the mirrors, a laser coupled to the analysis region and configured to emit light of a wavelength range and to enable a plurality of reflections of the emitted light between the mirrors, a detector coupled to the analysis region and configured to detect a portion of the emitted light impinging on the detector and to generate a corresponding signal, and an electronic system coupled to the laser and the detector, and configured to adjust the wavelength range of the emitted light from the laser based on the generated signal, and to measure the concentration of the trace gas based on the generated signal.

Claims

1. An open-path laser spectrometer for measuring a concentration of a trace gas, the open-path laser spectrometer comprising:

an open-path multi-pass analysis region comprising a first mirror, a second mirror at a distance and orientation from the first mirror, and a support structure for locating the first and second mirrors;

a laser coupled to the open-path multi-pass analysis region and configured to emit light of a wavelength range and to enable a plurality of reflections of the emitted light between the first and second mirrors;

a detector coupled to the open-path multi-pass analysis region and configured to detect a portion of the emitted light impinging on the detector and to generate a signal corresponding to a characteristic of the detected portion of the emitted light; and

an electronic system coupled to the laser and the detector, and configured to adjust the wavelength range of the emitted light from the laser based on the generated signal, and to measure the concentration of the trace gas based on the generated signal.

2. The open-path laser spectrometer of claim 1, wherein the trace gas is methane.

3. The open-path laser spectrometer of claim 1,

wherein the trace gas exhibits a resonant frequency response in the wavelength range of the emitted light, and

wherein other gases in the atmosphere do not exhibit resonant frequency responses in the wavelength range.

4. The open-path laser spectrometer of claim 1, wherein the laser comprises a semiconductor laser diode operating in an infrared range.

5. The open-path laser spectrometer of claim 1, wherein the wavelength range is from about 3.2 μ

m to about 3.5 μ

m.

6. The open-path laser spectrometer of claim 1, wherein the open-path multi-pass analysis region is exposed to the ambient atmosphere.

7. The open-path laser spectrometer of claim 1, wherein an optical path in the open-path multi-pass analysis region is at near ambient temperature and at near ambient pressure.

8. The open-path laser spectrometer of claim 1,

wherein the open-path multi-pass analysis region comprises a Herriott cell,

wherein the first and second mirrors are opposing concave mirrors, and

wherein the first mirror comprises a first hole configured to allow light to enter and/or exit the open-path multi-pass analysis region.

9. The open-path laser spectrometer of claim 8,

wherein the first hole is configured to allow the emitted light to enter the open-path multi-pass analysis region, and

wherein the second mirror comprises a second hole configured to allow the reflected light to exit the open-path multi-pass analysis region.

10. The open-path laser spectrometer of claim 1, wherein the open-path laser spectrometer is configured to utilize a direct laser absorption and/or 2f modulation/demodulation spectrometry techniques.

11. The open-path laser spectrometer of claim 1, wherein the electronic system comprises a global positioning system (GPS) configured to track a location of the open-path laser spectrometer and to synchronize the location with the generated signal of the detector.

12. The open-path laser spectrometer of claim 1, wherein the electronic system further comprises a wireless transceiver configured to enable communication between the open-path laser spectrometer and an external device.

13. The open-path laser spectrometer of claim 1, wherein the open-path laser spectrometer has a trace-gas detection sensitivity of about 10 parts per billion (ppb) in 1 second.

14. The open-path laser spectrometer of claim 1, wherein the open-path laser spectrometer is portable and hand-held.

15. The open-path laser spectrometer of claim 1, wherein the distance between the first and second mirrors is between about 8 cm and about 20 cm and a total optical path length of the open-path multi-pass analysis region is more than 4 m.

16. The open-path laser spectrometer of claim 1, further comprising a thermoelectric cooler (TEC) configured to control a temperature of an emission source of the laser,

wherein the electronic system is configured to adjust the wavelength range of the emitted light from the laser by detecting a wavelength shift in a spectrum of the generated signal, and by signaling the TEC to control the temperature of the emission source of the laser.

17. A method for measuring a concentration of a trace gas comprising:

providing an open-path laser spectrometer comprising;

an analysis region comprising a first minor and a second mirror at a distance from the first mirror;

a laser;

a detector; and

an electronic system,

wherein the laser is configured to emit light of a wavelength range toward the second minor, the emitted light reflecting off of the first and second mirrors a plurality of times before impinging on the detector;

exposing the analysis region of the open-path laser spectrometer to the ambient atmosphere;

detecting, by the detector, a characteristic of the impinging light, and generating, by the detector, a signal corresponding the detected characteristic of the impinging light;

adjusting, by the electronic system, the wavelength range of the emitted light from the laser based on the generated signal; and

measuring, by the electronic system, a concentration of the trace gas based on the generated signal.

18. The method of claim 17, wherein exposing the analysis region comprises exposing an optical path in a region between the first and second mirrors to an ambient temperature and an ambient pressure.

19. The method of claim 17,

wherein the trace gas exhibits a resonant frequency response in the wavelength range of the emitted light, and

wherein other gases in the atmosphere do not exhibit resonant frequency responses in the wavelength range.

20. The method of claim 17, wherein the open-path laser spectrometer further comprises

a thermoelectric cooler (TEC) configured to control a temperature of an emission source of the laser,

wherein adjusting the wavelength range of the emitted light from the laser comprises:

detecting, by the electronic system, a wavelength shift in a spectrum of the generated signal, and

signaling, by the electronic system, the TEC to control the temperature of the emission source of the laser.