METHOD OF DESIGN-BASED DEFECT CLASSIFICATION AND SYSTEM THEREOF
First Claim
1. A computer-implemented method for classifying defects detected on a production layer of a specimen, the method comprising:
- obtaining input data related to the detected defects;
processing the input data using a decision algorithm associated with the production layer and specifying two or more classification operations and a sequence thereof;
sorting the processed defects in accordance with predefined bins,wherein each bin is associated with at least one classification operation,wherein at least one classification operation sorts at least part of the processed defects to one or more classification bins to yield finally classified defects, and wherein each classification operation, excluding the last one, sorts at least part of the processed defects to be processed by one or more of the following classification operations; and
storing at least finally classified defects in a storage medium.
0 Assignments
0 Petitions
Accused Products
Abstract
There is provided an inspection method capable of classifying defects detected on a production layer of a specimen. The method comprises: obtaining input data related to the detected defects; processing the input data using a decision algorithm associated with the production layer and specifying two or more classification operations and a sequence thereof; and sorting the processed defects in accordance with predefined bins, wherein each bin is associated with at least one classification operation, wherein at least one classification operation sorts at least part of the processed defects to one or more classification bins to yield finally classified defects, and wherein each classification operation, excluding the last one, sorts at least part of the processed defects to be processed by one or more of the following classification operations.
-
Citations
22 Claims
-
1. A computer-implemented method for classifying defects detected on a production layer of a specimen, the method comprising:
-
obtaining input data related to the detected defects; processing the input data using a decision algorithm associated with the production layer and specifying two or more classification operations and a sequence thereof; sorting the processed defects in accordance with predefined bins, wherein each bin is associated with at least one classification operation, wherein at least one classification operation sorts at least part of the processed defects to one or more classification bins to yield finally classified defects, and wherein each classification operation, excluding the last one, sorts at least part of the processed defects to be processed by one or more of the following classification operations; and storing at least finally classified defects in a storage medium. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
-
-
13. An inspection system capable of classifying defects detected on a production layer of a specimen, the inspection system comprising a classification unit operatively coupled to at least one inspection tool and to a design data storing unit, wherein the classification unit comprises:
-
a defect data interface configured to obtain defect-indicative data from the at least one inspection tool; a design data interface configured to obtain design-indicative data from the design data storing unit; a memory configured to store finally classified defects; and a processor configured to process the defect-indicative data and the design-indicative data using a decision algorithm associated with the production layer and specifying two or more classification operations and a sequence thereof;
the processor is further configured to sort the processed defects in accordance with predefined bins,wherein each bin is associated with at least one classification operation; wherein at least one classification operation sorts at least part of the processed defects to one or more classification bins to yield finally classified defects; and wherein each classification operation, excluding the last one, sorts at least part of the processed defects to be processed by one or more of the following classification operations. - View Dependent Claims (14, 15, 16, 17)
-
-
18. A classification unit operable in conjunction with an inspection system capable of classifying defects detected on a production layer of a specimen, the classification unit comprising a processor operatively coupled to a memory accessible by the processor and configured to store finally classified defects, wherein the processor is configured to process defect-indicative data and design-indicative data using a decision algorithm associated with the production layer and specifying two or more classification operations and a sequence thereof;
- the processor is further configured to sort the processed defects in accordance with predefined bins;
wherein each bin is associated with at least one classification operation; wherein at least one classification operation sorts at least part of the processed defects to one or more classification bins to yield finally classified defects; and wherein each classification operation, excluding the last one, sorts at least part of the processed defects to be processed by one or more of the following classification operations. - View Dependent Claims (19, 20, 21, 22)
- the processor is further configured to sort the processed defects in accordance with predefined bins;
Specification