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SYSTEM AND METHOD OF DETECTION AND ANALYSIS FOR SEMICONDUCTOR CONDITION PREDICTION

  • US 20140214354A1
  • Filed: 01/27/2014
  • Published: 07/31/2014
  • Est. Priority Date: 01/28/2013
  • Status: Abandoned Application
First Claim
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1. A method for monitoring an electronic component based on selecting a set of measurements, the method comprising the steps of:

  • identifying the set of measurements based on parameters related to the monitoring of the component;

    performing the set of measurements to provide measurement data;

    evaluating the measurement data to determine if any measurement from the set of measurements can be improved by providing data filtering and data correction; and

    processing the measurement data for the set of measurements against a set of corresponding reference measurements to provide analysis of the monitoring.

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