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WAVELENGTH SCANNING INTERFEROMETER AND METHOD FOR ASPHERIC SURFACE MEASUREMENT

  • US 20140218750A1
  • Filed: 04/04/2014
  • Published: 08/07/2014
  • Est. Priority Date: 03/15/2012
  • Status: Active Grant
First Claim
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1. A wavelength scanning interferometer for an aspheric surface measurement, characterized by, comprising a translation platform (1), a measured aspheric surface (2), a first mirror group (3), a light splitter (4), a beam expander (6), a tunable laser (7), an imaging lens (8), a CCD camera (9), a reference plane mirror (10), an image card (11), a computer (12) and a data card (13), wherein the measured aspheric surface (2) is fixed on the translation platform (1), the measured aspheric surface (2), the first mirror group (3), the light splitter (4), the imaging lens (8) and the CCD camera (9) are coaxially placed in sequence, the reference plane mirror (10) is arranged at the bottom of the light splitter (4), the CCD camera (9), the image card (11), the computer (12) and the data card (13) are connected in sequence, the beam expander (6) is connected with the tunable laser (7), and the translation platform (1) and the tunable laser (7) are connected with the data card (13) respectively;

  • a light beam emitted by the tunable laser (7) is expanded by the beam expander (6) to become a parallel light beam with wavefront divided into two beams by the light splitter (4), one beam is incident on the reference plane mirror (10) to become a reference light, and the other beam is focused by the first mirror group (3) and then is incident on the measured aspheric surface (2), the lights reflected by the reference mirror (10) and the measured aspheric surface (2) are re-superposed on the light splitter (4) to form interference;

    interference fringes are acquired by the CCD camera (9) after passing through the imaging lens (8), and encounter optical-electric conversion in the CCD camera (9) and then analogue-digital conversion in the image card (11), and finally enter into the computer (12) which performs signal processing so as to obtain an optical path difference and surface shape information.

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