METHOD AND APPARATUS FOR IMAGE SENSOR CALIBRATION

• US 20140231630A1
• Filed: 02/14/2014
• Published: 08/21/2014
• Est. Priority Date: 02/18/2013
• Status: Abandoned Application

• Current Assignee: Stmicroelectronics (Research & Development) Limited (STMicroelectronics NV)
• Original Assignee: Stmicroelectronics (Research & Development) Limited (STMicroelectronics NV)
• Inventors: Rae, Bruce, Moore, John Kevin
• Application Number:
  US14/180,819
• Publication Number:
  US 20140231630A1
• Time in Patent Office: Days
• US Class Current: 250/214.1
• CPC Class Codes: G01J 1/08 Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
• CPC Class Codes: G01S 17/10 using transmission of interrupted, pulse-modulated waves determination of distance by phase measurements G01S17/32
• CPC Class Codes: G01S 7/4863 Detector arrays, e.g. charge-transfer gates
• CPC Class Codes: G01S 7/4865 Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak peak detection in noise, signal conditioning G01S7/487
• CPC Class Codes: G01S 7/497 Means for monitoring or calibrating
• CPC Class Codes: H01L 31/02019 for devices characterised by at least one potential jump barrier or surface barrier
• CPC Class Codes: H01L 31/09 Devices sensitive to infrared, visible or ultraviolet radiation H01L31/101 takes precedence
• CPC Class Codes: H03K 17/941 using an optical detector H03K17/968 takes precedence

Abstract

A photon sensitive device is provided with a voltage. A controller is configured to control a voltage source so as to cause at least one calibration voltage to be applied to the photon sensitive device in a calibration mode in order to determine the voltage to be provided by the voltage source in a normal mode of operation.

Claims

1. An apparatus, comprising:

an array of photon sensitive devices, each photon sensitive device configured to be provided with a voltage when in use;

a digital counter configured to receive output from the array of photon sensitive devices; and

a controller configured to control a voltage source to apply at least two calibration voltages to the photon sensitive devices of the array in a calibration mode and further configured to determine said voltage to be provided by the voltage source in a normal mode of operation by;

receiving output counter values from the digital counter for each of the at least two calibration voltages during calibration mode; and

using the received counter values to determine the voltage to be provided by the voltage source in the normal mode of operation.

2. The apparatus as claimed in claim 1, wherein said controller is configured to cause the apparatus to be in said calibration mode at regular intervals.

3. The apparatus as claimed in claim 1, wherein said controller is configured to cause the apparatus to be in said calibration mode in response to one or more conditions being satisfied.

4. The apparatus as claimed in claim 1, wherein said controller is configured to control said voltage source to apply a first calibration voltage followed by at least one successive calibration voltage, the or each successive calibration voltage being decreased.

5. The apparatus as claimed in claim 1, wherein said controller is configured to control said voltage source to apply a first calibration voltage followed by at least one successive calibration voltage, the or each successive calibration voltage being increased.

6. The apparatus as claimed in claim 1, wherein said controller is configured to control said voltage source to apply a first calibration voltage followed by at least one successive calibration voltage, and wherein said first calibration voltage is selected to be one of a voltage below a breakdown voltage of the photon sensitive device and a voltage which causes the photon sensitive device to be in a state of breakdown.

7. The apparatus as claimed in claim 1, wherein said controller is configured to control said voltage source to apply a first calibration voltage followed by at least one successive calibration voltage, and wherein said successive calibration voltages are applied until the photon sensitive device operates as required in the normal mode of operation.

8. The apparatus as claimed in claim 1, wherein an offset is applied to a calibration voltage which is determined to allow operation of the photon sensitive device in the normal mode of operation.

9. The apparatus as claimed in claim 1, comprising a light source, said light source being controlled by said controller and being configured to be activated in said calibration mode.

10. The apparatus as claimed in claim 9, wherein the photon sensitive device is configured to be shielded from light other than said light source, when said apparatus is in the calibration mode.

11. The apparatus as claimed in claim 1, further comprising an additional photon sensitive device, said photon sensitive device being used in said calibration mode and said additional photon sensitive device being used in said normal mode of operation, said determined voltage being applied to said additional photon sensitive device in said normal mode of operation.

12. The apparatus as claimed in claim 1, wherein the photon sensitive device comprises a single photon avalanche diode.

13. The apparatus as claimed in claim 1, comprising said voltage source, wherein said voltage source comprises a charge pump.

14. The apparatus as claimed in claim 1, wherein the digital counter comprises counting circuitry configured to provide a count on activation of the photon sensitive device, said counting circuitry providing count information to said controller.

15. The apparatus of claim 1 provided in the form of an integrated circuit.

16. A method, comprising:

controlling a voltage source to apply at least two calibration voltages to a photon sensitive device in a calibration mode;

counting in a counter coupled to an output of the photon sensitive device counter values for each of the at least two calibration voltages; and

determining a voltage to be provided by the voltage source in a normal mode of operation, wherein determining comprises;

receiving counter values output from the counter for each of the at least two calibration voltages; and

using the received counter values to determine the voltage to be provided by the voltage source in the normal mode of operation.

17. The method as claimed in claim 16, comprising performing said calibration mode at regular intervals.

18. The method as claimed in claim 16, comprising performing said calibration mode in response to one or more conditions being satisfied.

19. The method as claimed in claim 16, comprising controlling said voltage source to apply a first calibration voltage followed by at least one successive calibration voltage, the or each successive calibration voltage being decreased.

20. The method as claimed in claim 16, comprising controlling said voltage source to apply a first calibration voltage followed by at least one successive calibration voltage, the or each successive calibration voltage being increased.

21. The method as claimed in claim 16, comprising controlling said voltage source to apply a first calibration voltage followed by at least one successive calibration voltage, wherein said first calibration voltage is one of a voltage below a breakdown voltage of the photon sensitive device and a voltage which causes the photon sensitive device to be in a state of breakdown.

22. The method as claimed in claim 16, comprising controlling said voltage source to apply a first calibration voltage followed by at least one successive calibration voltage, and applying successive calibration voltages until the photon sensitive device operates as required in the normal mode of operation.

23. The method as claimed in claim 16, comprising applying an offset to a calibration voltage which is determined to allow operation of the photon sensitive device in the normal mode of operation.

24. The method as claimed in claim 16, comprising controlling a light source to be activated in said calibration mode.

25. The method as claimed in claim 16, wherein the photon sensitive device comprises a single photon avalanche diode.

26. The method as claimed in claim 16, wherein said voltage source comprises a charge pump.

27. The method as claimed in claim 16, wherein the counter values comprise an activation count of the photon sensitive device.