SINGLE MOTOR DYNAMIC CALIBRATION UNIT
First Claim
1. A calibration unit comprising:
- (a) a single axis rotation unit configured to extend at an angle relative to a known axis and to rotate about a rotation axis;
(b) a test head connected to the single axis rotation unit; and
(c) a position on the test head configured to receive a device under test (DUT);
(d) wherein rotation of the test head about the rotation axis allows for excitation of at least three degrees of freedom of the DUT.
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Accused Products
Abstract
A calibration unit, system, and method for calibrating a device under test are provided. The calibration unit, system, and method use a single axis rotational unit to calibrate devices under test on a test head. The single axis rotation unit is configured to extend at an angle from a known axis. The test head can be designed in the shape of a frustum with multiple sides. The calibration unit, system, and method can use combinations of gravitational excitation, Helmholtz coil excitation, and rotational rate excitation for calibrating the device under test. The calibration unit, system, and method can calibrate a 3 degree for freedom or higher MEMS devices.
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Citations
24 Claims
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1. A calibration unit comprising:
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(a) a single axis rotation unit configured to extend at an angle relative to a known axis and to rotate about a rotation axis; (b) a test head connected to the single axis rotation unit; and (c) a position on the test head configured to receive a device under test (DUT); (d) wherein rotation of the test head about the rotation axis allows for excitation of at least three degrees of freedom of the DUT. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method for configuring devices under test (DUTS), comprising:
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(a) loading a device under test (DUT) onto a test head at a loading position; (b) rotating the test head around a single rotation axis to a first fixed position, wherein the single rotation axis is at an angle relative to a known axis; (c) exciting the DUT at the first fixed position; (d) rotating the test head around the single rotation axis to a second fixed position; (e) exciting the DUT at the second fixed position; and (f) unloading the DUT at an unloading position; (g) wherein the exciting the DUT at the first and second positions allows for excitation of at least three degrees of freedom of the DUT. - View Dependent Claims (15, 16, 17, 18, 19, 20)
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21. A triaxis MEMS calibration system, comprising:
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(a) a calibration unit comprising; (b) a single axis rotation unit configured to extend at an angle relative to a known axis and to rotate about a rotation axis; (c) a test head connected to the single axis rotation unit; and (d) a position on the test head configured to receive a device under test (DUT); (e) wherein rotation of the test head about the rotation axis allows for excitation of at least three degrees of freedom of the DUT; and (f) a turret handler configured to place the DUT in the position prior to rotation and remove the DUT from the position after rotation. - View Dependent Claims (22, 23, 24)
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Specification