MAGNETIC FIELD PROBE AND PROBE HEAD THEREOF
First Claim
1. A probe head comprising:
- an inner metal layer configured for receiving a magnetic field to be measured;
a shielding unit configured for shielding the inner metal layer, the shielding unit comprising;
a first shielding metal layer stacked above the inner metal layer; and
a second shielding metal layer stacked below the inner metal layer; and
a filtering unit configured for filtering out an electric field interfering with the inner metal layer, the filtering unit comprising;
a first filtering metal layer stacked between the first shielding metal layer and the inner metal layer; and
a second filtering metal layer stacked between the second shielding metal layer and the inner metal layer.
1 Assignment
0 Petitions
Accused Products
Abstract
A magnetic field probe and a probe head thereof are disclosed herein. The probe head includes an inner metal layer, a shielding unit, and a filtering unit. The inner metal layer receives a magnetic field to be measured. The shielding unit, including a first shielding metal layer and a second shielding metal layer, shields the inner metal layer. The first and the second shielding metal layer are respectively stacked above and below the inner metal layer. The filtering unit, including a first filtering metal layer and a second filtering metal layer, filters out an electric field interfering with the inner metal layer. The first filtering metal layer is stacked between the first shielding metal layer and the inner metal layer. The second filtering metal layer is stacked between the second shielding metal layer and the inner metal layer.
-
Citations
19 Claims
-
1. A probe head comprising:
-
an inner metal layer configured for receiving a magnetic field to be measured; a shielding unit configured for shielding the inner metal layer, the shielding unit comprising; a first shielding metal layer stacked above the inner metal layer; and a second shielding metal layer stacked below the inner metal layer; and a filtering unit configured for filtering out an electric field interfering with the inner metal layer, the filtering unit comprising; a first filtering metal layer stacked between the first shielding metal layer and the inner metal layer; and a second filtering metal layer stacked between the second shielding metal layer and the inner metal layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
-
11. A magnetic field probe comprising:
-
a probe head comprising; a first annular shielding metal portion having a gap; a second annular shielding metal portion stacked below the first annular shielding metal portion, the second annular shielding metal portion having another gap, and a shape of the second annular shielding metal portion corresponding to a shape of the first annular shielding metal portion; a receiving metal portion stacked between the first annular shielding metal portion and the second annular shielding metal portion, the receiving metal portion being configured for receiving a magnetic field to be measured to generate a sensing signal, the first annular shielding metal portion and the second annular shielding metal portion being configured for shielding the receiving metal portion; a first annular filtering metal portion stacked between the first annular shielding metal portion and the receiving metal portion, the first annular filtering portion being configured for filtering out an electric field interfering with the receiving metal portion, and the first annular filtering metal portion having a first gap, a first end, and a second end across the first gap; and a second annular filtering metal portion stacked between the second annular shielding metal portion and the receiving metal portion, the second annular filtering portion being configured for to filtering out the electric field interfering with the receiving metal portion, and the second annular filtering metal portion having a second gap, a third end, and a fourth end across the second gap; and a probe body connected to the probe head, the probe body being configured for receiving the sensing signal from the receiving metal portion and transmitting the sensing signal to a measuring instrument. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19)
-
Specification