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LABORATORY TESTING-BASED VALVE PROGNOSTICS

  • US 20140261791A1
  • Filed: 03/14/2014
  • Published: 09/18/2014
  • Est. Priority Date: 03/14/2013
  • Status: Active Application
First Claim
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1. A method for developing a projected lifetime profile for a component of a process control device, the method comprising:

  • receiving, at an integrated diagnostics module, an identification of the component of the process control device, wherein the component is capable of experiencing mechanical wear or fatigue, over time, during operation of the process control device, and receiving, at the integrated diagnostics module, an operating parameter corresponding to the component, wherein the mechanical wear or fatigue of the component varies with changes in the operating parameter;

    receiving, at the integrated diagnostics module, previously-recorded performance data of a reference component, where the previously-recorded performance data were collected during operation of the reference component under conditions compatible with conditions under which the process control device is to operate; and

    developing, in a profiler, the projected lifetime profile for the component based on the previously-recorded performance data, wherein the projected lifetime profile indicates a projected lifetime of the component as a function of values of the operating parameter.

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