ANALOG BLOCK AND TEST BLOCKS FOR TESTING THEREOF
First Claim
1. An apparatus, comprising:
- a system-on-chip having at least one analog block, an input/output interface, a data test block, and a processing unit;
wherein the processing unit is coupled to the input/output interface to control access to the at least one analog block;
wherein the data test block is coupled to the at least one analog block through the input/output interface;
wherein the processing unit is coupled to the data test block and configured to execute test code having at least one test pattern; and
wherein the data test block under control of the test code executed by the processing unit is configured to test the at least one analog block with the test pattern.
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Abstract
An apparatus relating generally to a system-on-chip is disclosed. In this apparatus, the system-on-chip has at least one analog block, an input/output interface, a data test block, and a processing unit. The processing unit is coupled to the input/output interface to control access to the at least one analog block. The data test block is coupled to the at least one analog block through the input/output interface. The processing unit is coupled to the data test block and configured to execute test code having at least one test pattern. The data test block under control of the test code executed by the processing unit is configured to test the at least one analog block with the test pattern.
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Citations
20 Claims
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1. An apparatus, comprising:
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a system-on-chip having at least one analog block, an input/output interface, a data test block, and a processing unit; wherein the processing unit is coupled to the input/output interface to control access to the at least one analog block; wherein the data test block is coupled to the at least one analog block through the input/output interface; wherein the processing unit is coupled to the data test block and configured to execute test code having at least one test pattern; and wherein the data test block under control of the test code executed by the processing unit is configured to test the at least one analog block with the test pattern. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method, comprising:
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testing an analog block to loop back a data sequence; providing configuration information to a configuration controller of a link test block; configuring an analog block under control of the configuration controller responsive to the configuration information; receiving the data sequence by a bit error rate tester of the link test block from the analog block; wherein the bit error rate tester is configured with test pattern information; wherein the data sequence is responsive to a test pattern associated with the test pattern information; determining a bit error rate by the bit error rate tester for the data sequence; and outputting the bit error rate. - View Dependent Claims (15, 16, 17, 18)
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19. A method comprising:
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providing configuration information to a configuration controller of a link test block; configuring an analog block under control of the configuration controller responsive to the configuration information; receiving application data by an eye scan controller of the link test block from the analog block via a first input/output bus; generating a data eye by the eye scan controller responsive to the application data; wherein the data eye is for settings of the analog block responsive to the configuration information; and outputting the data eye. - View Dependent Claims (20)
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Specification