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ANALOG BLOCK AND TEST BLOCKS FOR TESTING THEREOF

  • US 20140281716A1
  • Filed: 03/13/2013
  • Published: 09/18/2014
  • Est. Priority Date: 03/13/2013
  • Status: Active Grant
First Claim
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1. An apparatus, comprising:

  • a system-on-chip having at least one analog block, an input/output interface, a data test block, and a processing unit;

    wherein the processing unit is coupled to the input/output interface to control access to the at least one analog block;

    wherein the data test block is coupled to the at least one analog block through the input/output interface;

    wherein the processing unit is coupled to the data test block and configured to execute test code having at least one test pattern; and

    wherein the data test block under control of the test code executed by the processing unit is configured to test the at least one analog block with the test pattern.

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