SYSTEM AND METHOD FOR RANDOM NOISE GENERATION
First Claim
1. A method of generating a noisy log likelihood ratio (LLR) for testing an error correction circuit of a nonvolatile memory storage module, the method comprising:
- generating a plurality of coefficients, each of the plurality of coefficients associated with one region of a plurality of regions defining a linear space proportionately divided according to an area under a probability distribution curve for a nonvolatile memory storage module;
generating a random sample;
comparing the random sample to one or more of the plurality of coefficients to identify the region of the plurality of regions of the probability distribution curve in which the random sample belongs, each of the plurality of regions of the probability distribution curve having an associated noisy log likelihood ratio (LLR); and
replacing the random sample with the noisy LLR of the identified region to generate a noisy LLR for testing an error correction circuit of the nonvolatile memory storage module.
7 Assignments
0 Petitions
Accused Products
Abstract
A random noise generation module for generating noisy LLRs for testing an error correction circuit of a nonvolatile memory storage module. The random noise generation module includes a coefficient generator for generating one or a plurality of coefficients, each of the plurality of coefficients associated with one region of a plurality of regions defining a linear space proportionately divided according to an area under a probability distribution curve for a nonvolatile memory storage module. The random noise generation module further includes a linear random number generator for generating a linear random number and a comparator for comparing the linear random number to one or more of the plurality of coefficients to identify the region of the plurality of regions of the probability distribution curve in which the linear random number belongs to generate a noisy LLR for testing an error correction circuit of a nonvolatile memory storage module.
-
Citations
20 Claims
-
1. A method of generating a noisy log likelihood ratio (LLR) for testing an error correction circuit of a nonvolatile memory storage module, the method comprising:
-
generating a plurality of coefficients, each of the plurality of coefficients associated with one region of a plurality of regions defining a linear space proportionately divided according to an area under a probability distribution curve for a nonvolatile memory storage module; generating a random sample; comparing the random sample to one or more of the plurality of coefficients to identify the region of the plurality of regions of the probability distribution curve in which the random sample belongs, each of the plurality of regions of the probability distribution curve having an associated noisy log likelihood ratio (LLR); and replacing the random sample with the noisy LLR of the identified region to generate a noisy LLR for testing an error correction circuit of the nonvolatile memory storage module. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
-
-
9. A random noise generation module for generating a noisy LLR for testing an error correction circuit of a nonvolatile memory storage module, the random noise generation module comprising:
-
a coefficient generator configured to generate a plurality of coefficients, each of the plurality of coefficients associated with one region of a plurality of regions defining a linear space proportionately divided according to an area under a probability distribution curve for a nonvolatile memory storage module; a comparator configured to compare a random sample received at the random noise generation module to one or more of the plurality of coefficients to identify the region of the plurality of regions of the probability distribution curve in which the random sample belongs, each of the plurality of regions of the probability distribution curve having an associated noisy log likelihood ratio (LLR); and a noisy LLR replacement module configured to replace the random sample with the noisy LLR of the identified region to generate a noisy LLR for testing an error correction circuit of the nonvolatile memory storage module. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17)
-
-
18. A system for testing an error correction circuit of a nonvolatile memory storage module, the system comprising:
-
a random noise generation module for generating a noisy LLR for testing an error correction circuit of a nonvolatile memory storage module, the random noise generation module comprising; a coefficient generator configured to identify a probability distribution curve for the nonvolatile memory storage module, to divide the probability distribution curve into a plurality of regions, to calculate the area under the probability distribution curve for each of the plurality of regions and to divide a linear space proportionately according to the area under the probability distribution curve for each of the plurality of regions to generate a plurality of coefficients, each of the plurality of regions of the probability distribution curve having an associated noisy log likelihood ratio (LLR); a comparator configured to compare a random sample received at the system to one or more of the plurality of coefficients to identify the region of the plurality of regions of the probability distribution curve in which the random sample belongs; a noisy LLR replacement module configured to replace the random sample with a noisy LLR of the identified region to generate a noisy LLR; and a decoder configured to receive the noisy LLR from the nonvolatile memory controller and configured to decode an encoded codeword stored in the nonvolatile memory storage module to test the error correction code circuit of the nonvolatile memory storage module. - View Dependent Claims (19)
-
-
20. A method for testing an error correction circuit of a nonvolatile memory controller, the method comprising:
-
generating a plurality of coefficients, each of the plurality of coefficients associated with one region of a plurality of regions defining a linear space proportionately divided according to an area under a probability distribution curve for a nonvolatile memory storage module; generating an encoded codeword comprising a plurality of bits; comparing the bits of the encoded codeword to one or more of the plurality of coefficients to identify the region of the plurality of regions of the probability distribution curve in which each of the bits of the encoded codeword belongs, each of the plurality of regions of the probability distribution curve having an associated noisy log likelihood ratio (LLR); replacing each bit of the encoded codeword with the noisy LLR of the identified region to generate a noisy encoded codeword; and providing the noisy encoded codeword to a decoder coupled to the random noise generation module, the decoder configured to recover the codeword from the noisy encoded codeword to test the error correction code circuit of the nonvolatile memory storage module.
-
Specification