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TESTING APPARATUS FOR PROVIDING PER PIN LEVEL SETTING

  • US 20140285228A1
  • Filed: 05/17/2013
  • Published: 09/25/2014
  • Est. Priority Date: 03/25/2013
  • Status: Active Grant
First Claim
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1. A testing apparatus for providing per pin level setting, the testing apparatus comprising:

  • a control unit comprising a field programmable gate array (FPGA) for providing a pulse width modulation (PWM) signal; and

    a filter circuit electrically connected to the control unit for receiving the PWM signal and outputting at least one direct current (DC) voltage.

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