PARALLEL OPTICAL EXAMINATIONS OF A SAMPLE
First Claim
1. A cartridge for the optical examination of a sample, comprising:
- a) a first sample chamber with a detection surface;
b) a second sample chamber;
wherein a first output light beam (L2) that originates from a total internal reflection at the detection surface and a second output light beam (L2′
) that comes from the interior of the second sample chamber can be received in an observation region (OR) adjacent to the cartridge; and
wherein at least one optical element is provided for redirecting the second output light beam (L2′
).
3 Assignments
0 Petitions
Accused Products
Abstract
The invention relates to a cartridge (400), a sensor device, and a method for the optical examination of a sample. A first output light beam that originates from a total internal reflection at a detection surface of a TIR chamber and a second output light beam (L2′) that comes from the interior of an inspectable chamber (420) are both received within an observation region (OR). Preferably, these output light beams are detected with the same light detector, e.g. an image sensor. The invention hence allows for observing a total internal reflection at the TIR chamber and for looking into the inspectable chamber (420) from the same observation region (OR). This is for example enabled by different inclinations of the windows encountered by the first and the second output light beams, by different optical elements (407) in the paths of the output light beams, and/or by light scattering surface structures in the inspectable chamber.
4 Citations
15 Claims
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1. A cartridge for the optical examination of a sample, comprising:
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a) a first sample chamber with a detection surface; b) a second sample chamber; wherein a first output light beam (L2) that originates from a total internal reflection at the detection surface and a second output light beam (L2′
) that comes from the interior of the second sample chamber can be received in an observation region (OR) adjacent to the cartridge; andwherein at least one optical element is provided for redirecting the second output light beam (L2′
). - View Dependent Claims (4, 8, 9, 10, 12, 13, 14)
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2. A sensor apparatus for the optical examination of a sample, comprising:
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a) a first sample chamber with a detection surface; b) a second sample chamber; c) at least one light detector that is arranged at an observation region (OR) to receive a first output light beam (L2) that originates from a total internal reflection at the detection surface and a second output light beam (L2′
) that comes from the interior of the second sample chamber;
wherein at least one optical element is provided redirecting the second output light beam (L2′
). - View Dependent Claims (6, 7, 15)
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3. A method for the optical examination of a sample, said method comprising the following steps:
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a) filling sample into a first sample chamber with a detection surface and into a second sample chamber; b) directing an input light beam (L1) to the detection surface such that it is totally internally reflected into a first output light beam (L2) which passes through an observation region (OR); c) generating a second output light beam (L2′
) in the second sample chamber that leaves said chamber and then also passes through said observation region (OR);
wherein the second output light beam (L2′
) is redirected by at least one optical element provided for redirecting;d) detecting the first output light beam (L2) and the second output light beam (L2′
) after their passage through the observation region (OR). - View Dependent Claims (5)
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11. (canceled)
Specification