METHOD AND AN APPARATUS FOR PARAMETERIZING A SENSOR
First Claim
1. A method for parameterizing a sensor (54) that is fitted on an object under test (1) on a test bench (2), wherein the sensor transmits information that is recorded by a recording device and therefrom, the spatial position (54(x,y,z)) of the sensor (54) is ascertained through a localization method, the ascertained sensor position (54(x,y,z)) is compared with geometric data of the object under test (1), and through this comparison, the position of the sensor (54) on the object under test (1) is determined, and subsequently, the sensor (54) is parameterized in that based on the ascertained position (54(x,y,z)) on the object under test (1), the variable physically measured by the sensor (54) is assigned to the localized sensor (54).
1 Assignment
0 Petitions
Accused Products
Abstract
Sensors in a test bench environment have to be parameterized in advance. This is a complex task that up to now has been performed mostly manually by a test bench engineer. In order to make the parameterization of a sensor (54) easier, it is proposed that the position of the sensor on the object under test (1) be ascertained through suitable localization methods and the ascertained position be compared with geometric data of the object under test (1), from which the position of the sensor (54) on the object under test (1) can be derived, and from this position on the object under test (1), the variable physically measured by the sensor (54) can be assigned to the sensor (54).
10 Citations
10 Claims
- 1. A method for parameterizing a sensor (54) that is fitted on an object under test (1) on a test bench (2), wherein the sensor transmits information that is recorded by a recording device and therefrom, the spatial position (54(x,y,z)) of the sensor (54) is ascertained through a localization method, the ascertained sensor position (54(x,y,z)) is compared with geometric data of the object under test (1), and through this comparison, the position of the sensor (54) on the object under test (1) is determined, and subsequently, the sensor (54) is parameterized in that based on the ascertained position (54(x,y,z)) on the object under test (1), the variable physically measured by the sensor (54) is assigned to the localized sensor (54).
- 6. An apparatus for parameterizing a sensor (54) that is fitted on an object under test (1) on a test bench (2), wherein a recording device is provided by means of which information transmitted by the sensor (54) can be recorded and can be transmitted to a localization unit (10), and therefrom, the localization unit (10) ascertains through a localization method the spatial position (54(x,y,z)) of the sensor (54), that a parameterization unit (3) is provided in which the ascertained sensor position (54(x,y,z)) can be compared with geometric data of the object under test (1), and through this comparison, the position (54(x,y,z)) of the sensor on the object under test (1) can be determined, and that subsequently, the sensor (54) can be parameterized by the parameterization unit (3) in that based on the ascertained position on the object under test (1), the variable physically measured by the sensor (54) can be assigned to the localized sensor (54).
Specification