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METHOD AND AN APPARATUS FOR PARAMETERIZING A SENSOR

  • US 20140303930A1
  • Filed: 10/02/2012
  • Published: 10/09/2014
  • Est. Priority Date: 10/27/2011
  • Status: Abandoned Application
First Claim
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1. A method for parameterizing a sensor (54) that is fitted on an object under test (1) on a test bench (2), wherein the sensor transmits information that is recorded by a recording device and therefrom, the spatial position (54(x,y,z)) of the sensor (54) is ascertained through a localization method, the ascertained sensor position (54(x,y,z)) is compared with geometric data of the object under test (1), and through this comparison, the position of the sensor (54) on the object under test (1) is determined, and subsequently, the sensor (54) is parameterized in that based on the ascertained position (54(x,y,z)) on the object under test (1), the variable physically measured by the sensor (54) is assigned to the localized sensor (54).

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