MEASUREMENT APPARATUS AND METHOD
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Abstract
A measurement system (5) comprises a radiation source (10) and a detection system (15), wherein the radiation source is arranged such that radiation from the radiation source is incident on a sample (25) and the detection system is configured to receive at least part of the radiation via the sample, wherein the system is reconfigurable so as to vary a path length that the radiation travels through the sample and/or a reflectance of at least one surface upon which the radiation is incident after passing through at least part of the sample. A property of the sample may be determined based on at least the first and second measurements.
18 Citations
72 Claims
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1-38. -38. (canceled)
- 39. A measurement system comprising a radiation source and a detection system, wherein the radiation source is arranged or arrangeable such that radiation from the radiation source is incident on a sample and the detection system is configured or configurable to receive at least part of the radiation via the sample, wherein the system is reconfigurable so as to vary a path length that the radiation travels through the sample and/or a reflectance of at least one surface upon which the radiation is incident after passing through at least part of the sample.
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62. A method of collecting optical measurements using a measurement system comprising a radiation source and detection system, the method comprising:
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configuring the system such that radiation from the radiation source passes through the sample along a first path length and/or is reflected from a surface having a first reflectivity; performing at least a first measurement that comprises measuring radiation from the sample after having passed through the first path length and/or having being reflected from the surface having the first reflectivity; configuring the system such that radiation from the radiation source passes through the sample along a second path length and/or is reflected from a surface having a second reflectance; performing at least a second measurement that comprises measuring radiation from the sample after having passed through the second path length and/or having being reflected from the surface having the second reflectivity; determining at least one property of the sample from at least the first and second measurements.
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- 63. An optical measurement system comprising a radiation source and detection system, wherein the detection system is mounted to a guide for moving the detection system between at least two collinear positions.
- 68. A sensor probe comprising two or more optical fibres for detecting radiation from a sample, wherein the at least one of the optical fibres is spaced apart from at least one other optical fibre and/or at least one optical fibre is angled with respect to at least one ether of the optical fibres.
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72. A sample holder, the sample holder comprising a sample chamber for holding the sample, wherein the sample chamber is divided or dividable into sections and/or the sample holder comprises a movable divider for varying a dimension of the sample chamber.
Specification