SYSTEM AND METHOD FOR DETECTING STRUCTURAL DEFECTS WITHIN A STENT
First Claim
1. A system for detecting defects within a structure of struts forming a stent, comprising:
- a power supply for applying an electrical potential to a proximal end and to a distal end of said stent in order to establish an electrical current flow between said proximal end and said distal end, anda temperature sensor, adjacent to said stent for detecting a defect within said structure of struts, said temperature sensor being adapted to measure a temperature profile of said stent.
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Accused Products
Abstract
The invention relates to a system (1) for detecting defects (12) within a structure of struts (2) forming a stent (3), the system comprising a power supply (8) for applying an electrical potential to a proximal end (9) and to a distal end (10) of said stent (3) in order to establish an electrical current flow between said proximal end (9) and said distal end (10), and a temperature sensor (7) such as a infrared camera, adjacent to said stent (3) for detecting a defect (12) within said structure of struts (2), said temperature sensor (7) being adapted to measure a temperature profile of said stent (3). Further, the invention relates to a respective method for detecting those defects (12).
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Citations
15 Claims
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1. A system for detecting defects within a structure of struts forming a stent, comprising:
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a power supply for applying an electrical potential to a proximal end and to a distal end of said stent in order to establish an electrical current flow between said proximal end and said distal end, and a temperature sensor, adjacent to said stent for detecting a defect within said structure of struts, said temperature sensor being adapted to measure a temperature profile of said stent. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method of detecting defects within a structure of struts forming a stent, said method comprising:
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establishing an electrical current flow between a proximal end and a distal end of said stent by applying an electrical potential to said proximal end and said distal end of said stent; measuring a temperature of the stent with a temperature sensor, and detecting said defect within said structure of struts by locating a spot within said structure of struts dissipating a differing temperature compared to an adjacent area within said structure of struts. - View Dependent Claims (12, 13)
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14. A system for detecting defects within a structure of struts forming a stent, comprising:
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a power supply for applying a D.C. voltage to a proximal end and to a distal end of said stent in order to establish an electrical current flow between said proximal end and said distal end; a clamping tool to hold the stent, said clamping tool including a drive mechanism for rotating the stent; a connector connected to said clamping tool and said power supply; an automatic loader adapted to automatically load the stent into said clamping tool; and an infrared camera, adjacent to said stent for detecting a defect within said structure of nitinol struts, said temperature sensor being adapted to measure a temperature profile of said stent. - View Dependent Claims (15)
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Specification