×

SYSTEM AND METHOD FOR DETECTING STRUCTURAL DEFECTS WITHIN A STENT

  • US 20140341251A1
  • Filed: 08/14/2012
  • Published: 11/20/2014
  • Est. Priority Date: 08/19/2011
  • Status: Abandoned Application
First Claim
Patent Images

1. A system for detecting defects within a structure of struts forming a stent, comprising:

  • a power supply for applying an electrical potential to a proximal end and to a distal end of said stent in order to establish an electrical current flow between said proximal end and said distal end, anda temperature sensor, adjacent to said stent for detecting a defect within said structure of struts, said temperature sensor being adapted to measure a temperature profile of said stent.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×