NON-LINEAR PARAMETER MEASURING METHOD AND SYSTEM STRONG TO NOISE
First Claim
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1. A nonlinearity parameter measuring method comprising:
- inputting a signal into a first probe that is connected to one end of a specimen;
filtering a signal being output from a second probe connected to another end of the specimen using a first band pass filter for filtering a fundamental wave and a second band pass filter for filtering a second harmonic wave, the first band pass filter and second band pass filter made of analogue filters;
amplifying the signal that went through the filtering using a first amplifier connected to an output end of the first band pass filter and configured to amplify the fundamental wave and a second amplifier connected to an output end of the second band pass filter and configured to amplify a second harmonic wave;
measuring a voltage of the signal that went through the amplifying;
calculating a correction function for the second probe;
calculating an amplitude of the fundamental wave and second harmonic wave using the correction function for the second probe calculated at the calculating of a correction function and the voltage calculated at the measuring of a voltage; and
calculating a nonlinearity parameter of the specimen using the amplitude of the fundamental wave and second harmonic wave calculated at the calculating of an amplitude.
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Abstract
A nonlinearity parameter measuring method and system is configured to separately process a signal of a fundamental wave and second harmonic wave that went through a probe attached to a specimen using a circuit including an analogue band pass filter and intermediate frequency amplifier, and minimize the effects caused by noise, thereby measuring an exact nonlinearity parameter.
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Citations
14 Claims
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1. A nonlinearity parameter measuring method comprising:
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inputting a signal into a first probe that is connected to one end of a specimen; filtering a signal being output from a second probe connected to another end of the specimen using a first band pass filter for filtering a fundamental wave and a second band pass filter for filtering a second harmonic wave, the first band pass filter and second band pass filter made of analogue filters; amplifying the signal that went through the filtering using a first amplifier connected to an output end of the first band pass filter and configured to amplify the fundamental wave and a second amplifier connected to an output end of the second band pass filter and configured to amplify a second harmonic wave; measuring a voltage of the signal that went through the amplifying; calculating a correction function for the second probe; calculating an amplitude of the fundamental wave and second harmonic wave using the correction function for the second probe calculated at the calculating of a correction function and the voltage calculated at the measuring of a voltage; and calculating a nonlinearity parameter of the specimen using the amplitude of the fundamental wave and second harmonic wave calculated at the calculating of an amplitude. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A nonlinearity parameter measuring system comprising:
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a signal inputter configured to input a signal into a first probe that is connected to one end of a specimen; a filter configured to filter a signal being output from a second probe connected to another end of the specimen using a first band pass filter for filtering a fundamental wave and a second band pass filter for filtering a second harmonic wave, the first band pass filter and second band pass filter made of analogue filters; a signal amplifier configured to amplify the signal that went through the filter using a first amplifier connected to an output end of the first band pass filter and configured to amplify the fundamental wave and a second amplifier connected to an output end of the second band pass filter and configured to amplify the second harmonic wave; a voltage measurer configured to measure a voltage of the signal that went through the signal amplifier; a correction function calculator configured to calculate a correction function for the second probe; an amplitude calculator configured to calculate an amplitude of the fundamental wave and second harmonic wave using the correction function for the second probe calculated by the correction function calculator and the voltage calculated by the voltage measurer; and a nonlinearity parameter calculator configured to calculate a nonlinearity parameter of the specimen using the amplitude of the fundamental wave and second harmonic wave calculated at the calculating of an amplitude. - View Dependent Claims (12, 13, 14)
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Specification