FAULT DETECTION APPARATUS

• US 20140372068A1
• Filed: 08/29/2014
• Published: 12/18/2014
• Est. Priority Date: 03/01/2012
• Status: Abandoned Application

• Current Assignee: Toshiba Memory Corporation (Kioxia Corporation)
• Original Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Inventors: SETO, Motoshi, Murakami, Hiroaki
• Application Number:
  US14/473,615
• Publication Number:
  US 20140372068A1
• Time in Patent Office: Days
• US Class Current: 702/117
• CPC Class Codes: G01D 21/00 Measuring or testing not otherwise provided for
• CPC Class Codes: G01R 27/16 Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
• CPC Class Codes: G01R 31/08 Locating faults in cables, transmission lines, or networks
• CPC Class Codes: G01R 31/11 using pulse reflection methods
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801
• CPC Class Codes: G01R 31/2853 Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections G01R31/31717 takes precedence; test of chip-to-PCB or lead-to-PCB connections G01R31/66
• CPC Class Codes: G01R 31/71 Testing of solder joints
• CPC Class Codes: G06F 17/40 Data acquisition and logging for input to computer G06F3/00
• CPC Class Codes: G16Z 99/00 Subject matter not provided for in other main groups of this subclass
• CPC Class Codes: H04B 17/00 Monitoring; Testing of line transmission systems H04B3/46; arrangements for monitoring or testing transmission systems employing electromagnetic waves other than radio waves H04B10/07
• CPC Class Codes: H04B 17/309 Measuring or estimating channel quality parameters
• CPC Class Codes: H04B 3/46 Monitoring; Testing

Abstract

A fault detection apparatus according to an embodiment is provided with a measurement unit, a memory unit, a control unit, and a display unit. The measurement unit measures a first time period taken until a reflection signal reflected on a fault of a test apparatus is received after a first signal is transmitted to the test apparatus. The memory unit includes a CAD data unit having CAD data of the test apparatus, and a model data unit to store model data indicating a relation between the first time period and a predicted conduction distance of the first signal according to the CAD data. The control unit calculates a range of a test object selected in the test apparatus based on the CAD data, calculates the predicted conduction distance from the first time period based on the model data, and specifies a position of a fault of the test apparatus which is separated by the predicted conduction distance from the measurement unit in the range of the test object. The display unit displays the position of the fault in the CAD data.

Claims

1. A fault detection apparatus comprising:

a measurement unit to measure a first time period taken until a reflection signal is received after a first signal is output to the test apparatus;

a memory including a first unit and a second unit, the first unit being capable of storing CAD data of the test apparatus, the second unit being capable of storing model data indicating a relation between the first time period and a conduction distance of the first signal;

a controller configured to calculate a test, object selected in the test, apparatus based on the CAD data, calculate the conduction distance based on the first time period, and specify a position of a fault, the position being separated by the conduction distance from the measurement unit; and

a display configured to display the CAD data and the position of the fault in the CAD data.

2. The fault detection apparatus according to claim 1, wherein

the first unit includes a third unit and a fourth unit, the third unit being capable of storing an image data, the image data being an image of a portion included in components of the test apparatus, the fourth unit being capable of storing a characteristics data, and the characteristics data including data of a position, a slope, a shape, and a material of the portion.

3. The fault detection apparatus according to claim 2, wherein

the memory further includes a fifth unit, and

the model data stored in the fifth unit is data represented by a function defining a conductivity characteristic of a pulse wave for each of the components or the portions.

4. The fault detection apparatus according to claim 1, wherein

the controller is provided with a RAM unit, a library unit, a division unit, and an operation unit,

the division unit divides image data of the CAD data into components of the test apparatus.

5. The fault detection apparatus according to claim 4, wherein

the library unit stores data indicating a determination reference for dividing the component into the portions.

6. The fault detection apparatus according to claim 4, wherein

when a fault, of the test apparatus is detected, the operation unit applies data output from the measurement unit to the model data to specify a fault of the component or the portion.

7. The fault detection apparatus according to claim 1, wherein

the first signal is input to the test apparatus through a probe abutting on an external terminal of the test apparatus.

8. The fault detection apparatus according to claim 1, wherein

the fault detection apparatus is applied to detect a short circuit or open circuit of a wiring or connection portion in a process of mounting the test apparatus.

9. The fault detection apparatus according to claim 1, wherein

a relation between a distance (L) to a fault of the test apparatus and the first time period (t), that is, a reflected-wave measurement time, is expressed as follows:

L=(C_o×

t)/{2×

∈

_ef^(1/2)}+A

(where, C₀ is a light speed, ∈

_ef is an effective relative dielectric constant, and A is a constant).

10. A fault detection apparatus comprising:

a measurement unit to measure a first time period taken until a reflection signal is received after a first signal is output to the test apparatus;

a memory including a first unit and a second unit, the first unit being capable of storing CAD data of the test apparatus, the second unit being capable of storing model data indicating a relation between the first time period and a conduction distance of the first signal, a relation between a distance (L) to a fault of the test apparatus and the first time period (t), that is, a reflected-wave measurement time, is expressed as follows;

L=(C_o×

t)/{2×

∈

_ef^(1/2)}+A

(where, C₀ is a light, speed, ∈

_ef is an effective relative dielectric constant, and A is a constant); and

a controller configured to specify a position of a fault, the position being separated by the conduction distance from the measurement unit.

11. The fault detection apparatus according to claim 10, further comprising:

a display configured to display the CAD data and the position of the fault in the CAD data.

12. The fault detection apparatus according to claim 10, wherein

the first unit includes a third unit and a fourth unit, the third unit being capable of storing an image data, the image data being an image of a portion included in components of the test apparatus, the fourth unit being capable of storing a characteristics data, and the characteristics data including data of a position, a slope, a shape, and a material of the portion.

13. The fault detection apparatus according to claim 12, wherein

the memory further includes a fifth unit, and

the model data stored in the fifth unit is data represented by a function defining a conductivity characteristic of a pulse wave for each of the components or the portions.

14. The fault detection apparatus according to claim 10, wherein

the controller is provided with a RAM unit, a library unit, a division unit, and an operation unit,

the division unit, divides image data of the CAD data into components of the test apparatus.

15. The fault detection apparatus according to claim 14, wherein

the library unit stores data indicating a determination reference for dividing the component into the portions.

16. The fault detection apparatus according to claim 14, wherein

when a fault of the test apparatus is detected, the operation unit applies data output from the measurement unit to the model data to specify a fault of the component or the portion.

17. The fault detection apparatus according to claim 10, wherein

the first signal is input to the test apparatus through a probe abutting on an external terminal of the test apparatus.

18. The fault detection apparatus according to claim 10, wherein

the fault detection apparatus is applied to detect a short circuit or open circuit of a wiring or connection portion in a process of mounting the test apparatus.