MEASUREMENT APPARATUS AND METHOD

• US 20150012245A1
• Filed: 02/13/2013
• Published: 01/08/2015
• Est. Priority Date: 02/13/2012
• Status: Abandoned Application

• Current Assignee: Taylor Hobson Limited (Ametek Incorporated)
• Original Assignee: Taylor Hobson Limited (Ametek Incorporated)
• Inventors: Xiao, Shaojun
• Application Number:
  US14/378,152
• Publication Number:
  US 20150012245A1
• Time in Patent Office: Days
• US Class Current: 702/168
• CPC Class Codes: G01B 11/2441 using interferometry
• CPC Class Codes: G01B 11/255 for measuring radius of curvature measuring diameter G01B11/08
• CPC Class Codes: G01B 21/04 by measuring coordinates of points
• CPC Class Codes: G01B 21/20 for measuring contours or curvatures, e.g. determining profile
• CPC Class Codes: G01M 11/025 by determining the shape of the object to be tested measuring contours or curvatures by optical means G01B11/24

Abstract

A computer implemented method of determining the surface shape of an aspheric object using a metrological apparatus includes positioning the object on a support surface of a turntable so that an axis of the object is tilted with respect to the axis of rotation of the turntable; using a measurement probe to make a first measurement of the object; rotating the turntable; after rotation of the turntable, using a measurement probe to make a second measurement of the object, diametrically opposite the first measurement, estimating a first angle based on fitting the first measurement data using a surface model including: a dependency on the axis tilt angle and a dependency on the radius of the base of the object; estimating a second angle based on fitting the second measurement data to the surface model; and determining the tilt angle based on the first angle and the second angle.

Claims

1. A computer implemented method of determining the surface shape of an aspheric object using a metrological apparatus, the method comprising:

positioning the object on a support surface of a turntable of the metrological apparatus so that an axis of the object is tilted with respect to the axis of rotation of the turntable by a tilt angle, α

;

using a measurement probe to make a first measurement of the object to provide first measurement data;

rotating the turntable;

after rotation of the turntable, using a measurement probe to make a second measurement of the object, diametrically opposite the first measurement, to provide second measurement data,

estimating a first angle, γ

₁, based on fitting the first measurement data using a surface model comprising;

a dependency on the axis tilt angle, α

, and

a dependency on the radius, R, of the base of the object;

estimating a second angle, γ

₂, based on fitting the second measurement data to the surface model; and

determining the axis tilt angle based on the first angle and the second angle.

2. The method of claim 1 in which determining the axis tilt angle based on the first angle and the second angle comprises determining the axis tilt angle based on the difference between the first angle and the second angle.

3. The method of claim 1 in which estimating the first angle comprises estimating the radius, R, of the base of the object, and optimising the estimate of the radius by fitting the surface model to the first measurement data, and determining the first angle based on the surface model and the optimised estimate of the radius.

4. The method of claim 1, in which estimating the second angle comprises estimating the radius, R, of the base of the object, and optimising the estimate of the radius by fitting the surface model to the second measurement data, and determining the second angle based on the surface model and the optimised estimate of the radius.

5. The method of claim 1 in which fitting the first or second measurement data comprises using a fixed estimate of the axis tilt angle, α

, whilst varying the estimate of radius R to optimise the fit of the surface model to said measurement data.

6. The method of claim 1 in which estimating the first angle comprises estimating the axis tilt angle, α

, and optimising the estimate of the axis tilt angle based on fitting the surface model to the first measurement data, and determining the first angle based on the surface model and the optimised estimate of the axis tilt angle, α

.

8. The method of claim 6 comprising estimating the aspheric center position, x₀, z₀, and using the estimated aspheric center position in optimising the estimate of the axis tilt angle.

10. The method of claim 1 in which fitting the first measurement data and/or second measurement data comprises treating the radius, R, as constant and fitting to determine the axis tilt angle.

13. The method of claim 1 in which the measurement probe of the metrological apparatus is aligned with the axis of rotation of the turntable.

14. The method of claim 1 in which the measurement probe of the metrological apparatus is tilted with respect to the axis of rotation of the turntable by an angle less than 70 °

.

17. The method of claim 1 in which the surface model comprises

19. The method of claim 1 comprising determining the tilt angle based on a measurement of a reference surface based on:

using a measurement probe to make a first measurement of the reference surface to provide first reference measurement data;

rotating the turntable;

after rotation of the turntable, using a measurement probe to make a second measurement of the object to provide second reference measurement data;

and determining the tilt angle of the measurement probe based on the first and second measurement data.

21. The method of claim 1 comprising determining an average of the first angle and the second angle and, in the event that the average is equal to a tilt angle of the measurement probe, determining the axis tilt angle based on the tilt angle of the probe and at least one of the first angle and the second angle.

22. The method of claim 1 comprising repeating the estimation of the first angle and the second angle based on the determined tilt angle, and in which estimating the first angle and estimating the second angle comprises updating an estimate of the radius, R, of the base of the object.

7. (canceled)

9. (canceled)

11. (canceled)

12. (canceled)

15. (canceled)

16. (canceled)

18. (canceled)

20. (canceled)

23. (canceled)

24. A metrological apparatus for determining the surface shape of an aspheric object, the apparatus comprising;

a turntable having a support surface for supporting an object to be measured, wherein the turntable is operable to rotate about a rotation axis;

a measurement probe operable to traverse a measurement path across the surface of the object to be measured to provide measurement data;

a controller operable to control the measurement probe to traverse a first measurement path to provide first measurement data and to rotate the turntable and, after rotation of the turntable, to control the measurement probe to traverse a second measurement path to provide second measurement data, wherein the first measurement path and the second measurement path are diametrically opposite each other on the surface of the object,

and a data processor configured to;

estimate a first angle, γ

₁, based on fitting the first measurement data using a surface model comprising;

a dependency on the axis tilt angle, α

, and a dependency on the radius, R, of the base of the object;

estimate a second angle, γ

₂, based on fitting the second measurement data to the surface model; and

to

determine the axis tilt angle based on at least one of the first angle and the second angle.

25. The metrological instrument of claim 24 in which the data processor is configured to perform the method comprising the steps of:

positioning the object on a su ort surface of a turntable of the metrological apparatus so that an axis of the object is tilted with respect to the axis of rotation of the turntable by a tilt angle, α

;

using a measurement probe to make a first measurement of the object to provide first measurement data;

rotating the turntable;

after rotation of the turntable, using a measurement probe to make a second measurement of the object, diametrically opposite the first measurement, to provide second measurement data,

estimating a first angle, γ

₁, based on fitting the first measurement data using a surface model comprising;

a dependency on the axis tilt angle, α

, and

a dependency on the radius, R, of the base of the object;

,

estimating a second angle, γ

₂, based on fitting the second measurement data to the surface model; and

determining the axis tilt angle based on a difference between the first angle and the second angle.

26. A data processor for a metrological instrument, wherein the processor is configured to:

receive first measurement data and second measurement data, wherein the first and second measurement data each provide a part of a measurement of the profile of the surface of an aspheric object to be measured;

estimate a first angle, γ

₁, based on fitting the first measurement data using a surface model comprising;

a dependency on the axis tilt angle, α

, and a dependency on the radius, R, of the base of the object;

estimate a second angle, γ

₂, based on fitting the second measurement data to the surface model; and

to

determine the axis tilt angle based on the tilt angle of the probe and at least one of the first angle and the second angle.

27. The data processor of claim 26 configured to perform a method comprising the steps of:

positioning the object on a support surface of a turntable of the metrological apparatus so that an axis of the object is tilted with respect to the axis of rotation of the turntable by a tilt angle, α

;

using a measurement probe to make a first measurement of the object to provide first measurement data;

rotating the turntable;

after rotation of the turntable, using a measurement probe to make a second measurement of the object, diametrically opposite the first measurement, to provide second measurement data,

estimating a first angle, γ

₁, based on fitting the first measurement data using a surface model comprising;

a dependency on the axis tilt angle, α

, and

a dependency on the radius, R, of the base of the object;

estimating a second angle, γ

₂, based on fitting the second measurement data to the surface model; and

determining the axis tilt angle based on a difference between the first angle and the second angle.

28. The data processor of claim 26 in which the processor is configured to determine an average of the first angle and the second angle and to update the estimate of the axis tilt angle to be used in the surface model in the event that the average is not equal to the tilt angle of the measurement probe.

29. (canceled)

30. A non-transitory computer readable medium storing program instructions operable to program a processor to perform a method comprising the steps of:

positioning the object on a support surface of a turntable of the metrological apparatus so that an axis of the object is tilted with respect to the axis of rotation of the turntable by a tilt angle, α

;

using a measurement probe to make a first measurement of the object to provide first measurement data;

rotating the turntable;

after rotation of the turntable, using a measurement probe to make a second measurement of the object, diametrically opposite the first measurement, to provide second measurement data,

estimating a first angle, γ

₁, based on fitting the first measurement data using a surface model comprising;

a dependency on the axis tilt angle, α

, and

a dependency on the radius, R, of the base of the object;

estimating a second angle, γ

₂, based on fitting the second measurement data to the surface model; and

determining the axis tilt angle based on the first angle and the second angle.

31. (canceled)

32. (canceled)

33. (canceled)