QUARTZ-TEMPERATURE-MEASUREMENT PROBE AND QUARTZ-TEMPERATURE-MEASUREMENT DEVICE
1 Assignment
0 Petitions
Accused Products
Abstract
A crystal oscillator (31) (Y-cut) has a temperature characteristic in which its oscillating frequency significantly changes with temperature, whereas a crystal oscillator (32) (AT-cut) has a temperature characteristic in which its oscillating frequency is stable with temperature. Crystal oscillators (31, 32) are cut from a raw material of the same type and configured to be substantially equal in shape, material, and size, and provide a combination of oscillation frequencies such that the frequency of a signal generated by a differential frequency circuit (35) will be less than or equal to 10 kHz within a measuring temperature range of 21 to 30° C. The frequency of a signal generated by differential frequency generating circuit (35) is output to a measurement apparatus main unit and a frequency counting circuit (15) measures the frequency of this signal by a reciprocal counting method to obtain at least eight or more significant digits.
-
Citations
5 Claims
-
1. (canceled)
-
2. A quartz temperature measuring probe comprising:
-
a first crystal oscillator of AT-cut orientation having a temperature characteristic in which its oscillating frequency is stable with temperature; a second crystal oscillator of Y-cut or LC-cut orientation having a temperature characteristic in which its oscillating frequency significantly changes with temperature as compared with the first crystal oscillator; a first oscillation circuit that generates a signal of a specific oscillating frequency, using the first crystal oscillator as an oscillation element; a second oscillation circuit that generates a signal of a specific oscillating frequency, using the second crystal oscillator as an oscillation element; and a differential frequency generating circuit that generates a signal of a differential frequency component between an oscillating frequency from the first oscillation circuit and an oscillating frequency from the second oscillation circuit, wherein the first crystal oscillator and the second crystal oscillator are cut from a raw material of the same type and configured to be substantially equal in shape and material, and provide a combination of oscillation frequencies such that the frequency of a signal which is generated by the differential frequency generating circuit will be less than or equal to 10 kHz within a preset measuring temperature range.
-
-
3. (canceled)
-
4. A quartz temperature measurement device comprising:
-
a quartz temperature measuring probe including a first crystal oscillator of AT-cut orientation having a temperature characteristic in which its oscillating frequency is stable with temperature, a second crystal oscillator of Y-cut or LC-cut orientation having a temperature characteristic in which its oscillating frequency significantly changes with temperature as compared with the first crystal oscillator, a first oscillation circuit that generates a signal of a specific oscillating frequency, using the first crystal oscillator as an oscillation element, a second oscillation circuit that generates a signal of a specific oscillating frequency, using the second crystal oscillator as an oscillation element, and a differential frequency generating circuit that generates a signal of a differential frequency component between an oscillating frequency from the first oscillation circuit and an oscillating frequency from the second oscillation circuit; and a measurement apparatus main unit including a frequency counter that measures the frequency of a signal received from the quartz temperature measuring probe, conversion means that converts a frequency measured by the frequency counter to a measurement temperature, and a display unit that displays a measurement temperature obtained by the conversion means, wherein the first crystal oscillator and the second crystal oscillator are cut from a raw material of the same type and configured to be substantially equal in shape and material, and provide a combination of oscillation frequencies such that the frequency of a signal which is generated by the differential frequency generating circuit will be less than or equal to 10 kHz within a preset measuring temperature range. - View Dependent Claims (5)
-
Specification