CIRCUIT LIFETIME MEASURING DEVICE AND METHOD

• US 20150035555A1
• Filed: 07/14/2014
• Published: 02/05/2015
• Est. Priority Date: 08/01/2013
• Status: Abandoned Application

• Current Assignee: Realtek Semiconductor Corp.
• Original Assignee: Realtek Semiconductor Corp.
• Inventors: Yeh, Ta-Hsun, Weng, Chi-Shun, Jean, Yuh-Sheng
• Application Number:
  US14/330,250
• Publication Number:
  US 20150035555A1
• Time in Patent Office: Days
• US Class Current: 324/762.01
• CPC Class Codes: G01R 31/2855 Environmental, reliability or burn-in testing
• CPC Class Codes: G01R 31/30 Marginal testing, e.g. by varying supply voltage testing computers during standby operation or idle time G06F11/22
• CPC Class Codes: G01R 31/31727 Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks G01R31/31725 takes precedence; concerning scan test G01R31/318552, for tester hardware G01R31/31922

Abstract

The present invention discloses a circuit lifetime measuring device to estimate the rest lifetime of a target circuit, comprising: a reference clock receiving end for receiving a reference clock; a correlation signal generating circuit for providing a correlation signal in which at least some operating settings of the correlation signal generating circuit and the target circuit vary synchronously; a storage circuit for storing an initial relation between the reference clock and the correlation signal; a measuring circuit, coupled to the reference clock receiving end and the correlation signal generating circuit, for measuring a present relation between the reference clock and the correlation signal; and an estimating circuit, coupled to the storage circuit and the measuring circuit, for generating an estimation value according to the initial relation and the present relation, wherein the estimation value indicates the rest lifetime of the target circuit.

Claims

1. a circuit lifetime measuring device to estimate the rest lifetime of a target circuit, comprising:

a correlation signal generating circuit for providing a correlation signal in which at least some operating settings of the correlation signal generating circuit and the target circuit vary correspondingly;

a storage circuit for storing an initial relation between a reference clock and the correlation signal;

a measuring circuit, coupled to the correlation signal generating circuit, for measuring a present relation between the reference clock and the correlation signal; and

an estimating circuit, coupled to the storage circuit and the measuring circuit, for generating an estimation value according to the initial relation and the present relation, wherein the estimation value indicates the rest lifetime of the target circuit.

2. The circuit lifetime measuring device of claim 1, further comprising:

a reference clock generating circuit for providing the reference clock which is a crystal clock or an oscillation clock derived from the crystal clock.

3. The circuit lifetime measuring device of claim 1, wherein the correlation signal generating circuit is coupled to the target circuit and provides the correlation signal according to a signal of the target circuit.

4. The circuit lifetime measuring device of claim 1, wherein the correlation signal is independent of the target circuit.

5. The circuit lifetime measuring device of claim 4, wherein the correlation signal generating circuit is a clock generating circuit while the correlation signal is a clock signal.

6. The circuit lifetime measuring device of claim 1, wherein the at least some operating settings include an operating voltage and/or an operating frequency.

7. The circuit lifetime measuring device of claim 1, wherein the target circuit is integrated into the circuit lifetime measuring device.

8. The circuit lifetime measuring device of claim 7, wherein the circuit lifetime measuring device is an integrated circuit.

9. The circuit lifetime measuring device of claim 1, wherein the storage circuit further stores a relative relation between a signal of the target circuit and the correlation signal, and the estimating circuit generates the estimation value according to the relative relation, the initial relation and the present relation.

10. The circuit lifetime measuring device of claim 1, further comprising:

a control circuit, coupled to the estimating circuit, for confining the variation range of the operating settings in accordance with the estimation value.

11. The circuit lifetime measuring device of claim 10, wherein the control circuit compares the estimation value with a threshold value, and adjusts the variation range of the operating settings if the estimation value reaches the threshold value.

12. The circuit lifetime measuring device of claim 1, wherein the operating settings of the correlation signal generating circuit and the target circuit vary synchronously or proportionally.

13. A circuit lifetime measuring method, which is carried out by a circuit lifetime measuring device for measuring the rest lifetime of a target circuit, comprising the following steps:

receiving a reference clock;

providing a correlation signal by a correlation signal generating circuit in which at least some operating settings of the correlation signal generating circuit and the target circuit vary correspondingly;

storing an initial relation between the reference clock and the correlation signal;

measuring a present relation between the reference clock and the correlation signal; and

generating an estimation value according to the initial relation and the present relation in which the estimation value indicates the rest lifetime of the target circuit.

14. The circuit lifetime measuring method of claim 13, further comprising:

storing a relative relation between a signal of the target circuit and the correlation signal,

wherein the step of generating the estimation value includes;

generating the estimation value according to the relative relation, the initial relation and the present relation.

15. The circuit lifetime measuring method of claim 13, further comprising:

confining the variation range of the operating settings according to the estimation value.

16. The circuit lifetime measuring method of claim 15, wherein the step of confining the variation range of the operating settings includes:

comparing the estimation value with a threshold value; and

reducing the variation range of the operating settings if the estimation value reaches the threshold value.

17. The circuit lifetime measuring method of claim 13, wherein the operating settings of the correlation signal generating circuit and the target circuit vary synchronously or proportionally.

18. The circuit lifetime measuring method of claim 13, wherein the correlation signal is independent of the target circuit.