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Addressable test circuit and test method for key parameters of transistors

  • US 20150042372A1
  • Filed: 10/26/2014
  • Published: 02/12/2015
  • Est. Priority Date: 11/28/2012
  • Status: Abandoned Application
First Claim
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1. A test method for testing a plurality of transistors, the method comprising:

  • measuring a saturation current and a leakage current of a transistor respectively through different test signal lines.

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