Storage Control System with Settings Adjustment Mechanism and Method of Operation Thereof

• US 20150046664A1
• Filed: 07/29/2014
• Published: 02/12/2015
• Est. Priority Date: 08/08/2013
• Status: Abandoned Application

• Current Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Original Assignee: Smart Storage Systems Incorporated (Western Digital Corporation)
• Inventors: Fitzpatrick, James, Park, Sheunghee, Rub, Bernardo, Higgins, James M.
• Application Number:
  US14/446,249
• Publication Number:
  US 20150046664A1
• Time in Patent Office: Days
• US Class Current: 711/156
• CPC Class Codes: G06F 3/0616 in relation to life time, e.g. increasing Mean Time Between Failures [MTBF]
• CPC Class Codes: G06F 3/0634 by changing the state or mode of one or more devices
• CPC Class Codes: G06F 3/0679 Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]

Abstract

Systems, methods and/or devices are used to enable a settings adjustment mechanism. In one aspect, the method includes (1) accessing characterization information corresponding to how a group of non-volatile memory devices of a storage control system operates as the group wears, (2) determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device, and (3) determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.

Claims

1. A method of operation of a storage control system comprising:

accessing characterization information corresponding to how a group of non-volatile memory devices of the storage control system operates as the group wears;

determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device; and

determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.

2. The method of claim 1, further comprising:

using the determined one or more settings for the non-volatile memory device to adjust operating characteristics of the non-volatile memory device.

3. The method of claim 1, wherein the characterization information identifies different settings to use for different ages of a respective non-volatile memory device of the group of non-volatile memory devices.

4. The method of claim 1, wherein the estimated age represents the estimated wear on the non-volatile memory device.

5. The method of claim 1, wherein the one or more settings for the non-volatile memory device are determined in accordance with the estimated age and the characterization information to promote even performance as the non-volatile memory device ages.

6. The method of claim 1, wherein the one or more settings for the non-volatile memory device are determined in accordance with the estimated age and the characterization information to promote even power usage as the non-volatile memory device ages.

7. The method of claim 1, wherein the one or more settings for the non-volatile memory device are determined in accordance with the estimated age and the characterization information to maximize endurance of the non-volatile memory device.

8. The method of claim 1, wherein determining the estimated age of the non-volatile memory device includes filtering that limits impact of outlier measurements on the estimated age.

9. A storage control system, comprising:

one or more processors; and

memory storing one or more programs to be executed by the one or more processors, the one or more programs comprising instructions for;

accessing characterization information corresponding to how a group of non-volatile memory devices of the storage control system operates as the group wears;

determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device; and

determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.

10. The storage control system of claim 9, wherein the one or more programs further comprise instructions for:

using the determined one or more settings for the non-volatile memory device to adjust operating characteristics of the non-volatile memory device.

11. The storage control system of claim 9, wherein the characterization information identifies different settings to use for different ages of a respective non-volatile memory device of the group of non-volatile memory devices.

12. The storage control system of claim 9, wherein the estimated age represents the estimated wear on the non-volatile memory device.

13. The storage control system of claim 9, wherein determining the estimated age of the non-volatile memory device includes filtering that limits impact of outlier measurements on the estimated age.

14. A non-transitory computer readable storage medium, storing one or more programs configured for execution by one or more processors of a storage control system, the one or more programs including instructions for:

accessing characterization information corresponding to how a group of non-volatile memory devices of the storage control system operates as the group wears;

determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device; and

determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.

15. The non-transitory computer readable storage medium of claim 14, wherein the one or more programs further include instructions for:

using the determined one or more settings for the non-volatile memory device to adjust operating characteristics of the non-volatile memory device.

16. The non-transitory computer readable storage medium of claim 14, wherein the characterization information identifies different settings to use for different ages of a respective non-volatile memory device of the group of non-volatile memory devices.

17. The non-transitory computer readable storage medium of claim 14, wherein the estimated age represents the estimated wear on the non-volatile memory device.

18. The non-transitory computer readable storage medium of claim 14, wherein determining the estimated age of the non-volatile memory device includes filtering that limits impact of outlier measurements on the estimated age.