METHODS AND APPARATUSES FOR LABEL-FREE PARTICLE ANALYSIS

• US 20150056645A1
• Filed: 08/15/2014
• Published: 02/26/2015
• Est. Priority Date: 08/22/2013
• Status: Active Grant

• Current Assignee: Kinetic River Corp.
• Original Assignee: Kinetic River Corp.
• Inventors: Vacca, Giacomo
• Granted Patent: US 9,778,193 B2
• Time in Patent Office: Days
• US Class Current: 435/29
• CPC Class Codes: G01N 15/1434 Optical arrangements
• CPC Class Codes: G01N 15/1459 the analysis being performed on a sample stream
• CPC Class Codes: G01N 2015/1006 for cytology
• CPC Class Codes: G01N 2015/1438 Using two lasers in succession
• CPC Class Codes: G01N 2021/653 Coherent methods [CARS]
• CPC Class Codes: G01N 21/65 Raman scattering
• CPC Class Codes: G01N 2201/06113 Coherent sources; lasers
• CPC Class Codes: G01N 2201/0697 Pulsed lasers

Abstract

An apparatus to provide a label-free or native particle analysis comprises a light generating system producing first light pulses at a first wavelength and second light pulses at a second wavelength; and a flow cell coupled to the light generating system to convey particles for analysis. The light generating system is configured to chirp at least one of the first light pulses and the second light pulses to analyze the particles.

Claims

1. An apparatus, comprising:

a light generating system producing a set of first light pulses at a first wavelength and a set of second light pulses at a second wavelength;

a flow cell coupled to the light generating system to convey, in a flow, particles for analysis; and

a first optical system coupled to the light generating system to chirp at least one of the first light pulses and the second light pulses to analyze the particles.

2. The particle analysis apparatus of claim 1, wherein the second wavelength is different from the first wavelength and wherein the set of first light pulses is only one light pulse at the first wavelength and the set of second light pulses is only one light pulse at the second wavelength.

3. The particle analysis apparatus of claim 1, further comprising:

a collecting and analyzing system to collect and analyze light resulting from an interaction of the first light pulses and the second light pulses with the particles.

4. The particle analysis apparatus of claim 1, further comprising:

a second optical system to combine the first light pulses and the second light pulses to deliver to the particles, wherein the particles are each exposed to a single combined light pulse from one of the first light pulses and one of the second light pulses and wherein the first light pulse is positively chirped and the second light pulse is negatively chirped.

5. The particle analysis apparatus of claim 1, further comprising:

a synchronization system to synchronize the first light pulses and the second light pulses.

6. The particle analysis apparatus of claim 1, further comprising:

a light source to illuminate the particles to generate a trigger light.

7. A particle analysis apparatus, comprising:

a light generating system producing first light pulses at a first wavelength and second light pulses at a second wavelength;

a flow cell coupled to the light generating system to convey a plurality of particles for analysis; and

a first optical system coupled to the light generating system to generate combined light pulses from the first light pulses and the second light pulses to deliver to the particles, wherein the particles are each exposed to only one of the combined light pulses.

8. The particle analysis apparatus of claim 7, wherein the second wavelength is different from the first wavelength.

9. The particle analysis apparatus of claim 7, further comprising:

a collecting and analyzing system to collect and analyze light resulting from the interaction of the combined light pulses with the particles.

10. The particle analysis apparatus of claim 7, further comprising:

a second optical system to chirp at least one of the first light pulses and the second light pulses.

11. The particle analysis apparatus of claim 7, further comprising:

a synchronization system to synchronize the first light pulses and the second light pulses.

12. A particle analysis apparatus, comprising:

a light generating system producing a first light pulse at a first wavelength and a second light pulse at a second wavelength;

a flow cell coupled to the light generating system to convey a particle for analysis;

a first optical system coupled to the light generating system to generate a combined light pulse from the first light pulse and the second light pulse to analyze the particle; and

a light source coupled to the light generating system to illuminate the particle to generate a trigger optical beam for the combined light pulse.

13. The particle analysis apparatus of claim 12, further comprising:

a second optical system coupled to the light generating system to chirp at least one of the first light pulse and the second light pulse.

14. The particle analysis apparatus of claim 12, further comprising:

a collecting and analyzing system to collect and analyze light resulting from the interaction of the combined light pulse with the particle.

15. A method to analyze particles comprising:

generating first light pulses at a first wavelength and second light pulses at a second wavelength;

conveying particles for analysis; and

chirping at least one of the first light pulses and the second light pulses to analyze the particles.

16. A method to analyze particles, comprising:

generating first light pulses at a first wavelength;

generating second light pulses at a second wavelength;

conveying a plurality of particles for analysis;

generating combined light pulses from the first light pulses and the second light pulses to deliver the particles; and

exposing each particle to one of the combined light pulses.

17. A method to analyze particles, comprising:

generating a first light pulse at a first wavelength;

generating a second light pulse at a second wavelength;

conveying a particle for analysis,

generating a combined light pulse from the first light pulse and the second light pulse to analyze the particle; and

illuminating the particle to generate a trigger optical beam for the combined light pulse.

18. An apparatus, comprising:

a light generating system producing a set of first light pulses at a first wavelength and a set of second light pulses at a second wavelength;

a chamber coupled to the light generating system to contain particles for analysis; and

a first optical system coupled to the light generating system to cross chirp the first light pulses and the second light pulses to analyze the particles, wherein the first light pulse is positively chirped and the second light pulse is negatively chirped.

19. The particle analysis apparatus of claim 18, wherein the second wavelength is different from the first wavelength and wherein the set of first light pulses is only one light pulse at the first wavelength and the set of second light pulses is only one light pulse at the second wavelength.

20. The particle analysis apparatus of claim 18, further comprising:

a collecting and analyzing system to collect and analyze light resulting from an interaction of the first light pulses and the second light pulses with the particles.

21. The particle analysis apparatus of claim 18, further comprising:

a second optical system to combine the first light pulses and the second light pulses to deliver to the particles, wherein the particles are each exposed to a single combined light pulse from one of the first light pulses and one of the second light pulses.