TEST PROGRAM

• US 20150058671A1
• Filed: 10/31/2014
• Published: 02/26/2015
• Est. Priority Date: 06/04/2012
• Status: Abandoned Application

• Current Assignee: Advantest Corporation
• Original Assignee: Advantest Corporation
• Inventors: Tahara, Yoshifumi, Suzuki, Takehisa, Arisawa, Akihiro
• Application Number:
  US14/530,323
• Publication Number:
  US 20150058671A1
• Time in Patent Office: Days
• US Class Current: 714/32
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
• CPC Class Codes: G01R 31/31912 Tester/user interface
• CPC Class Codes: G06F 11/263 Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
• CPC Class Codes: G06F 11/2733 Test interface between tester and unit under test

Abstract

A test program allows an information technology equipment connected to a tester hardware to control the tester hardware. The tester hardware is configured to be capable of changing at least a part of its functions according to configuration data stored in rewritable nonvolatile memory. The test program is configured as a combination of a control program and a test algorithm module. The test program comprises: a module that receives a selection instruction for selecting a test item specified by the user from among test items that correspond to the test algorithm modules held by the storage device; a module that receives a test condition required to execute the selected test item; and a module that controls the tester hardware so as to supply a signal to a device under test according to the test algorithm and test condition, and to receive a signal from the device under test.

Claims

1. A test program embedded on a non-transitory computer-readable recording medium, allowing an information technology equipment connected to a tester hardware to control the tester hardware, wherein the tester hardware comprises rewritable memory, and is configured to be capable of changing at least a part of its functions according to configuration data stored in the memory, and wherein the test program is configured as a combination of a control program and a test algorithm module embedded in the control program so as to define a test algorithm, and wherein the information technology equipment comprises a storage device, and wherein the storage device holds a test algorithm module that has already been acquired by the user, the test program comprising:

a module that receives a selection instruction for selecting a test item specified by the user from among test items that correspond to the test algorithm modules held by the storage device;

a module that receives a test condition required to execute the selected test item; and

a module that controls the tester hardware so as to supply a signal to a device under test according to the test algorithm and test condition, and to receive a signal from the device under test.

2. The test program according to claim 1, wherein the test algorithm module held by the storage device is acquired from an external server that holds a plurality of test algorithm modules that define different test algorithms.

3. The test program according to claim 1, wherein the test program is configured as a combination of a control program, a test algorithm module that is embedded in the control program and that defines the test algorithm, and an analysis tool module that defines an evaluation algorithm for processing and analyzing data obtained as a result of the test, and wherein the storage device further holds the analysis tool module that has already been acquired by the user, the test program further comprising:

a module that receives a selection instruction for selecting an analysis tool specified by the user from among analysis tools that correspond to the analysis tool modules held by the storage device;

a module that receives an analysis condition required to execute the selected analysis tool; and

a module that processes and analyzes data acquired by the tester hardware according to the analysis condition.

4. The test program according to claim 3, wherein the analysis tool module held by the storage device is acquired from an external server that holds a plurality of analysis tool modules that define different evaluation algorithms.