Method and System for Predicting Storage Device Failures
First Claim
1. A method of predicting storage device failures, the method comprising:
- obtaining data regarding input and output of at least one storage device;
normalizing the obtained data to determine duty cycle of the at least one storage device; and
determining a likelihood of failure of the at least one storage device using the normalized data.
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Abstract
The invention pertains to a method and information handling system (IHS) for predicting storage device failures. An embodiment of the method of the present invention begins by obtaining data regarding input and output of the at least one storage device. Next, the obtained data is normalized to determine a duty cycle of the at least one storage device. Finally, using the normalized data, a likelihood of failure of the at least one storage device is determined. In another example embodiment, a failure indicator is associated with the at least one storage device based upon the determined likelihood of failure.
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Citations
19 Claims
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1. A method of predicting storage device failures, the method comprising:
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obtaining data regarding input and output of at least one storage device; normalizing the obtained data to determine duty cycle of the at least one storage device; and determining a likelihood of failure of the at least one storage device using the normalized data. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. An information handling system (IHS) comprising:
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a data module configured to obtain data regarding input and output of at least one storage device; a normalizing module communicatively coupled to the data module and configured to normalize the obtained data to determine duty cycle of the at least one storage device; and an assessment module configured to determine a likelihood of failure of the at least one storage device using the normalized data. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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19. A non-transitory computer readable medium having stored thereon a sequence of instructions which, when loaded and executed by a processor coupled to an apparatus, causes the apparatus to:
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obtain data regarding input and output of at least one storage device; normalize the obtained data to determine duty cycle of the at least one storage device; and determine a likelihood of failure of the at least one storage device using the normalized data.
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Specification