PRESSURE SENSOR AND PRESSURE SENSOR MANUFACTURING METHOD

• US 20150082894A1
• Filed: 08/21/2014
• Published: 03/26/2015
• Est. Priority Date: 09/24/2013
• Status: Abandoned Application

• Current Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Original Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Inventors: FUKUZAWA, Hideaki, FUJI, Yoshihiko, HARA, Michiko, OKAMOTO, Kazuaki, HIGASHI, Yoshihiro
• Application Number:
  US14/464,829
• Publication Number:
  US 20150082894A1
• Time in Patent Office: Days
• US Class Current: 73/723
• CPC Class Codes: A61B 2562/0247 Pressure sensors
• CPC Class Codes: A61B 5/021 Measuring pressure in heart or blood vessels A61B5/0205 takes precedence
• CPC Class Codes: G01L 9/16 by making use of variations in the magnetic properties of material resulting from the application of stress
• CPC Class Codes: Y10T 29/4913 Assembling to base an electrical component, e.g., capacitor, etc.

Abstract

According to one embodiment, a pressure sensor includes: a support unit; a substrate; and a plurality of sensing elements. The substrate is supported by the support unit and deformable. The plurality of sensing elements are provided on a part of the substrate. The sensing element includes a first magnetic layer, a second magnetic layer, and an intermediate layer. Magnetization of the first magnetic layer changes according to deformation of the substrate. Magnetization of the second magnetic layer is fixed. The intermediate layer is provided between the first magnetic layer and the second magnetic layer. A direction of the magnetization of the second magnetic layer of a first sensing element among the plurality of sensing elements is different from a direction of the magnetization of the second magnetic layer of a second sensing element among the plurality of sensing elements.

Claims

1. A pressure sensor comprising:

a support unit;

a substrate supported by the support unit, the substrate being deformable; and

a plurality of sensing elements provided on a part of the substrate,

the sensing element including

a first magnetic layer in which magnetization changes according to deformation of the substrate,

a second magnetic layer in which magnetization is fixed, and

an intermediate layer provided between the first magnetic layer and the second magnetic layer, and

a direction of the magnetization of the second magnetic layer of a first sensing element among the plurality of sensing elements being different from a direction of the magnetization of the second magnetic layer of a second sensing element among the plurality of sensing elements.

2. The sensor according to claim 1, wherein

the support unit has a hollow part provided under the substrate, and

the plurality of sensing elements are disposed along an edge portion of the substrate.

3. The sensor according to claim 2, wherein

a difference between an angle formed by a straight line connecting a centroid of the first sensing element and the edge portion in the shortest distance and the magnetization of the second magnetic layer of the first sensing element and an angle formed by a straight line connecting a centroid of the second sensing element and the edge portion in the shortest distance and the magnetization of the second magnetic layer of the second sensing element is within 5°

.

4. The sensor according to claim 2, wherein

a difference between an angle formed by a straight line connecting a centroid of the first sensing element and the centroid of the substrate and the magnetization of the second magnetic layer of the first sensing element and an angle formed by a straight line connecting a centroid of the second sensing element and the centroid of the substrate and the magnetization of the second magnetic layer of the second sensing element is within 5°

.

5. The sensor according to claim 1, wherein

a difference between an angle formed by the magnetization of the first magnetic layer of the first sensing element and the magnetization of the second magnetic layer of the first sensing element and an angle formed by the magnetization of the first magnetic layer of the second sensing element and the magnetization of the second magnetic layer of the second sensing element is within 5°

.

6. The sensor according to claim 1, wherein

a surface of the sensing element in a direction perpendicular to a stacked direction from the second magnetic layer to the first magnetic layer has shape anisotropy in which a length of a first axis is longer than a length of a second axis crossing the first axis.

7. The sensor according to claim 6, wherein

a difference between an angle formed by a straight line connecting a centroid of the first sensing element and the edge portion in the shortest distance and the first axis of the first sensing element and an angle formed by a straight line connecting a centroid of the second sensing element and the edge portion in the shortest distance and the first axis of the second sensing element is within 5°

.

8. The sensor according to claim 6, wherein

a difference between an angle formed by a straight line connecting a centroid of the first sensing element and a centroid of the substrate and the first axis of the first sensing element and an angle formed by a straight line connecting a centroid of the second sensing element and a centroid of the substrate and the first axis of the second sensing element is within 5°

.

9. The sensor according to claim 6, wherein

when an external force is not applied to the pressure sensor, the magnetization of the first magnetic layer is directed in a direction parallel to the first axis having the shape anisotropy.

10. The sensor according to claim 6, wherein

a difference between an angle formed by the magnetization of the second magnetic layer of the first sensing element and the first axis of the first sensing element and an angle formed by the magnetization of the second magnetic layer of the second sensing element and the first axis of the second sensing element is within 5°

.

11. The sensor according to claim 1, wherein

a surface of the sensing element in a direction perpendicular to a stacked direction from the second magnetic layer to the first magnetic layer has shape isotropy in which a length of a first axis is equal to a length of a second axis perpendicular to the first axis.

12. The sensor according to claim 11, wherein

when elements among the sensing elements having the shape isotropy have sides, a difference between an angle formed by a straight line connecting a centroid of the first sensing element and the edge portion in the shortest distance and one side of the first sensing element and an angle formed by a straight line connecting a centroid of the second sensing element and the edge portion in the shortest distance and one side of the second sensing element is within 5°

.

13. The sensor according to claim 11, wherein

when the elements among the sensing elements having the shape isotropy have the sides, a difference between an angle formed by a straight line connecting a centroid of the first sensing element and a centroid of the substrate and one side of the first sensing element and an angle formed by a straight line connecting a centroid of the second sensing element and the centroid of the substrate and one side of the second sensing element is within 5°

.

14. The sensor according to claim 1, wherein

at least two among the plurality of sensing elements are electrically connected to each other in series.

15. The sensor according to claim 1, wherein

at least two among the plurality of sensing elements are electrically connected to each other in parallel.

16. A method for manufacturing a pressure sensor comprising:

forming a deformable substrate;

forming a plurality of sensing elements on the substrate, which includes forming, on the substrate, a first magnetic layer in which magnetization changes according to deformation of the substrate, forming a second magnetic layer, and forming an intermediate layer between the first magnetic layer and the second magnetic layer; and

performing heat treatment of the sensing elements in a state where the substrate is deformed due to an external pressure.

17. The method according to claim 16, wherein

magnetization of the second magnetic layer is fixed by the heat treatment based on a direction of stress caused in the sensing elements by the external pressure.

18. The method according to claim 16, wherein

the heat treatment for fixing the magnetization of the second magnetic layer is performed at a temperature between 250°

C. and 400°

C.

19. The method according to claim 16, wherein

the external pressure is generated by causing a pressure difference to occur between a space above the substrate and a space under the substrate.

20. The method according to claim 16, wherein

a size of the external pressure applied to spaces above and under the substrate is less than or equal to 30 kilopascals.