LEDS WITH IMPROVED LIGHT EXTRACTION
First Claim
Patent Images
1. A light extraction structure comprising:
- a base material with a first refractive index; and
a scattering material with a second refractive index disposed within the base material, wherein the scattering material is a metal oxide;
wherein the difference between the first and second refractive indices is at least +/−
0.05.
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Abstract
A light extraction structure that includes a composition of a base material and a scattering material disposed within the base material. The scattering material is a metal oxide, and the difference between the refractive indices of the base material and the scattering material is at least +/−0.05.
8 Citations
33 Claims
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1. A light extraction structure comprising:
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a base material with a first refractive index; and a scattering material with a second refractive index disposed within the base material, wherein the scattering material is a metal oxide; wherein the difference between the first and second refractive indices is at least +/−
0.05. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A light extraction structure comprising:
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a first layer comprising a base material with a first refractive index and a scattering material with a second refractive index disposed within the base material; and a planarization layer with a third refractive index disposed directly over the base material. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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28. A light emitting diode (LED) comprising:
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a substrate; a light extraction structure disposed directly over the substrate and comprising a first layer comprising a base material and a scattering material, wherein the scattering material comprises a metal oxide; a first electrode disposed over the light extraction structure; a plurality of layers of semiconductor materials disposed over the first electrode; and a second electrode disposed over the layers of semiconductor materials, wherein the light extraction structure is configured to reduce the amount of total internal reflection that occurs within the semiconductor materials. - View Dependent Claims (29, 30, 31, 32, 33)
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Specification