TIME-DOMAIN REFLECTOMETER DE-EMBED PROBE

• US 20150084660A1
• Filed: 06/27/2014
• Published: 03/26/2015
• Est. Priority Date: 09/25/2013
• Status: Abandoned Application

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Knierim, Daniel G., Hickman, Barton T.
• Application Number:
  US14/317,389
• Publication Number:
  US 20150084660A1
• Time in Patent Office: Days
• US Class Current: 324/754.03
• CPC Class Codes: G01R 1/06772 High frequency probes
• CPC Class Codes: G01R 27/28 Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in line transmission systems H04B3/46
• CPC Class Codes: G01R 31/2839 using signal generators, power supplies or circuit analysers G01R31/2879 takes precedence; multimeters G01R15/12, network analysers G01R27/28
• CPC Class Codes: G01R 31/31908 Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
• CPC Class Codes: G01R 35/002 of cathode ray oscilloscopes

Abstract

A de-embed probe including an input configured to connect to a device under test, a memory, a signal generator connected to the input, the signal generator configured to generate a test signal, and a controller connected to the signal generator and configured to control the signal generator. The de-embed probe may be used in a test and measurement system. The test and measurement system also includes a test and measurement instrument including a processor connected to the controller of the de-embed probe, the processor configured to provide instructions to the controller, and a test and measurement input to receive an output from the de-embed probe.

Claims

1. A de-embed probe, comprising:

an input configured to connect to a device under test;

a memory;

a signal generator connected to the input, the signal generator configured to generate a test signal; and

a controller connected to the signal generator and configured to control the signal generator.

2. The de-embed probe of claim 1, wherein an input impedance of the de-embed probe is higher than a characteristic impedance of the device under test.

3. The de-embed probe of claim 2, wherein the de-embed probe does not include any switchable load components.

4. The de-embed probe of claim 2, the controller further configured to switch the signal generator on and off.

5. The de-embed probe of claim 2, the controller further configured to adjust an amplitude of the test signal.

6. The de-embed probe of claim 2, where the de-embed probe comprises two inputs configured to connect to a device under test.

7. A test and measurement system, comprising:

the de-embed probe of claim 2; and

a test and measurement instrument including;

a processor connected to the controller of the de-embed probe, the processor configured to provide instructions to the controller, and

a test and measurement input to receive an output from the de-embed probe.

8. The test and measurement system of claim 7, wherein the test and measurement instrument further includes a user interface configured to accept an indication of a desired amplitude of the test signal.

9. The test and measurement system of claim 7, wherein the processor automatically selects an amplitude of the test signal based on an amplitude of a received signal from a device under test at the test and measurement input, and wherein the controller is further configured to adjust the amplitude of the test signal based on the selection.

10. The test and measurement system of claim 7, wherein the processor of the test and measurement instrument receives from the test and measurement instrument an output from the device under test and calculates the source impedance of the device under test.

11. The test and measurement system of claim 7, wherein the processor of the test and measurement instrument receives an output from the device under test and calculates the unloaded signal present on the device under test before the de-embed probe connects to the device under test.

12. A method for performing a voltage measurement of a test signal within an active device under test, comprising:

injecting a test signal into a node of the device under test; and

separating a first voltage measurement related to a signal of the device under test from a second voltage measurement related to the test signal.

13. The method of claim 12, wherein the test signal is injected randomly compared to the signal from the device under test, and

wherein separating the first voltage measurement related to the signal of the device under test from the second voltage measurement related to the test signal includes:

triggering an acquisition each time the test signal is injected, and

averaging the acquisitions to determine the second voltage measurement related to the test signal.

14. The method of claim 12, wherein the test signal is injected at times fixed to the signal from the device under test, and

wherein separating the first voltage measurement related to the signal of the device under test from the second voltage measurement related to the test signal includes:

acquiring an acquisition when the test signal is on,

acquiring an acquisition when the test signal is off, and

subtracting the acquisition when the test signal is off from the acquisition when the test signal is on to determine the second voltage measurement related to the test signal.