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ANGLE-DEPENDENT X-RAY DIFFRACTION IMAGING SYSTEM AND METHOD OF OPERATING THE SAME

  • US 20150085983A1
  • Filed: 09/20/2013
  • Published: 03/26/2015
  • Est. Priority Date: 09/20/2013
  • Status: Active Grant
First Claim
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1. An x-ray diffraction imaging (XDI) system having a system axis, said system comprising:

  • at least one x-ray source configured to generate x-rays directed toward an object that includes at least one substance, wherein said at least one x-ray source is further configured to irradiate at least one voxel defined within the object with x-rays arriving from a plurality of directions, each direction defined by an angle of incidence with respect to the system axis;

    at least one detector configured to detect scattered x-rays after the x-rays have passed through the object; and

    at least one processor coupled to said at least one detector, said at least one processor programmed to generate a plurality of XDI profiles of the object voxel, wherein each XDI profile is a function of an associated angle of incidence.

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