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Resistive Touch Sensor System and Method

  • US 20150091858A1
  • Filed: 09/26/2014
  • Published: 04/02/2015
  • Est. Priority Date: 09/27/2013
  • Status: Active Grant
First Claim
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1. A resistive touch sensor system comprising:

  • (a) touch sensor array (TSA);

    (b) array column driver (ACD);

    (c) column switching register (CSR);

    (d) column driving source (CDS);

    (e) array row sensor (ARS);

    (f) row switching register (RSR);

    (g) analog to digital converter (ADC); and

    (h) computing control device (CCD);

    whereinsaid TSA comprises a variable impedance array (VIA) comprising VIA columns and VIA rows;

    said VIA comprises a first layer having a top side and a bottom side;

    said first layer comprises a force sensing material;

    said VIA comprises a second layer having a top side and a bottom side;

    said second layer comprises exposed coplanar drive electrodes;

    said second layer further comprises coplanar sense electrodes;

    said VIA is configured to electrically couple a plurality of interlinked impedance columns (IIC) within said TSA with a plurality of interlinked impedance rows (IIR) within said TSA;

    said IIC further comprises a plurality of individual column impedance elements (ICIE) electrically connected in series between said drive electrodes;

    said IIR further comprises a plurality of individual row impedance elements (IRIE) electrically connected in series between said sense electrodes;

    said ACD is configured to select said IIC within said TSA based on said CSR;

    said ACD is configured to electrically drive said selected IIC using said CDS;

    said CDS is configured to power one or more of said drive electrodes while driving one or more of said drive electrodes to ground potential;

    said ARS is configured to select said IIR within said TSA based on said RSR while simultaneously driving one or more of said sense electrodes to ground potential;

    said ADC is configured to sense the electrical state of said selected IIR and convert said electrical state to a sensed digital value (SDV);

    said electrical state is determined by the sum of current contributions of variable impedance elements within said VIA, where the current contribution of each element is determined by a voltage divider formed between the columns of said VIA, a current divider formed between the rows of said via, and the state of the impedance element, to produce a sensed current for a given row-column intersection with said VIA; and

    said CCD is configured to sample said SDV from said ADC at a plurality of positions within said TSA to form a touch sensor matrix (TSM) data structure.

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