SYSTEM AND METHOD FOR MEASURING AN ANALYTE IN A SAMPLE
First Claim
1. A system for determining a processing or system error, the system comprising:
- a test strip having a first electrode and a second electrode defining an electrochemical cell that is sized and configured to receive a sample, anda test meter configured to generate at least one pre-determined voltage between the electrodes for a predetermined amount of time and at least one resulting current of the sample during the pre-determined time, the test meter including a processor for receiving a set of data, the data including at least one applied voltage and at least one resulting current, wherein the processor is configured to utilize the set of data to determine a processing or system error.
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Accused Products
Abstract
Methods of determining a corrected analyte concentration in view of some error source are provided herein. The methods can be utilized for the determination of various analytes and/or various sources of error. In one example, the method can be configured to determine a corrected glucose concentration in view of an extreme level of hematocrit found within the sample. In other embodiments, methods are provided for identifying various system errors and/or defects. For example, such errors can include partial-fill or double-fill situations, high track resistance, and/or sample leakage. Systems are also provided for determining a corrected analyte concentration and/or detecting some system error.
6 Citations
15 Claims
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1. A system for determining a processing or system error, the system comprising:
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a test strip having a first electrode and a second electrode defining an electrochemical cell that is sized and configured to receive a sample, and a test meter configured to generate at least one pre-determined voltage between the electrodes for a predetermined amount of time and at least one resulting current of the sample during the pre-determined time, the test meter including a processor for receiving a set of data, the data including at least one applied voltage and at least one resulting current, wherein the processor is configured to utilize the set of data to determine a processing or system error. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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Specification