CONTINUOUS WEB INLINE TESTING APPARATUS, DEFECT MAPPING SYSTEM AND RELATED METHODS
First Claim
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1. A continuous web inline Hipot testing and web defect mapping system.
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Abstract
In at least selected embodiments, an industrial size continuous Hipot testing system has defect mapping capability capable of finding pinholes, weak spots, and/or embedded conductive particles in non-conductive sheet materials. Continuous testing is made possible through a pair of uniquely designed rollers, such as conductive polymer rollers. Automatic defect mapping is also incorporated into the system through the integration of the Hipot testing and line scan camera systems. The unit potentially has wide applications in many industries, such as, for example, semi-conductors and electronics, medical, high end packaging, and so forth.
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Citations
23 Claims
- 1. A continuous web inline Hipot testing and web defect mapping system.
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18. A method of Hipot testing and defect mapping.
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19. A method of Hipot testing and defect mapping as shown and described herein.
Specification