DEFECT JUDGING DEVICE, RADIOGRAPHY SYSTEM, AND DEFECT JUDGING METHOD
First Claim
1. A defect judging device that judges the presence/absence of a defect in an inspection subject based on detected-image data obtained by a radiographic device that detects radiation that has passed through the inspection subject, the defect judging device comprising:
- a position identifying portion for identifying a position of a feature site in the detected-image data based on a shape of the feature site of the inspection subject indicated by feature data that are stored in a storage portion in advance; and
a defect judging portion for extracting a defect candidate with reference to the feature site in the detected-image data identified by the position identifying portion and of judging the presence/absence of a defect in the inspection subject based on a characteristic quantity of a defect indicated by defect characteristic data stored in the storage portion in advance and a characteristic quantity of the defect candidate.
1 Assignment
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Accused Products
Abstract
With an image processing device (20), the presence/absence of a product defect is judged based on detected-image data obtained by a radiographic device that detects radiation that has passed through a product, which is an inspection subject. With the image processing device (20), a position of a product feature in the detected-image data is identified based on a shape of the product feature indicated by feature data stored in a DB storage portion (36) in advance, defect candidates are extracted with reference to the identified product feature in the detected-image data, and the presence/absence of a product defect is judged based on characteristic quantities of product defects indicated by the defect characteristic DB stored in the DB storage portion (36) in advance and characteristic quantities of the defect candidates.
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Citations
8 Claims
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1. A defect judging device that judges the presence/absence of a defect in an inspection subject based on detected-image data obtained by a radiographic device that detects radiation that has passed through the inspection subject, the defect judging device comprising:
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a position identifying portion for identifying a position of a feature site in the detected-image data based on a shape of the feature site of the inspection subject indicated by feature data that are stored in a storage portion in advance; and a defect judging portion for extracting a defect candidate with reference to the feature site in the detected-image data identified by the position identifying portion and of judging the presence/absence of a defect in the inspection subject based on a characteristic quantity of a defect indicated by defect characteristic data stored in the storage portion in advance and a characteristic quantity of the defect candidate. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A defect judging method that, based on detected-image data obtained by a radiographic device that detects radiation that has passed through an inspection subject, judges the presence/absence of a defect in the inspection subject, the defect judging method comprising:
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a first step of identifying a position of a feature site in the detected-image data based on a shape of the feature site of the inspection subject indicated by feature data that are stored in a storage portion in advance; and a second step of extracting a defect candidate with reference to the feature site in the detected-image data identified in the first step and of judging the presence/absence of a defect in the inspection subject based on a characteristic quantity of a defect indicated by defect characteristic data stored in the storage portion in advance and a characteristic quantity of the defect candidate.
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Specification