DEFECT JUDGING DEVICE, RADIOGRAPHY SYSTEM, AND DEFECT JUDGING METHOD

• US 20150131779A1
• Filed: 06/07/2013
• Published: 05/14/2015
• Est. Priority Date: 06/08/2012
• Status: Active Grant

• Current Assignee: Mitsubishi Heavy Industries, Ltd.
• Original Assignee: Mitsubishi Heavy Industries, Ltd.
• Inventors: Tomita, Tsuyoshi, Sugimoto, Kiichi, Fujitomi, Yosuke, Kiya, Atsushi, Takano, Akemi, Takeda, Hidenori
• Granted Patent: US 9,733,200 B2
• Time in Patent Office: Days
• US Class Current: 378/58
• CPC Class Codes: G01N 23/04 and forming images of the material

Abstract

With an image processing device (20), the presence/absence of a product defect is judged based on detected-image data obtained by a radiographic device that detects radiation that has passed through a product, which is an inspection subject. With the image processing device (20), a position of a product feature in the detected-image data is identified based on a shape of the product feature indicated by feature data stored in a DB storage portion (36) in advance, defect candidates are extracted with reference to the identified product feature in the detected-image data, and the presence/absence of a product defect is judged based on characteristic quantities of product defects indicated by the defect characteristic DB stored in the DB storage portion (36) in advance and characteristic quantities of the defect candidates.

Claims

1. A defect judging device that judges the presence/absence of a defect in an inspection subject based on detected-image data obtained by a radiographic device that detects radiation that has passed through the inspection subject, the defect judging device comprising:

a position identifying portion for identifying a position of a feature site in the detected-image data based on a shape of the feature site of the inspection subject indicated by feature data that are stored in a storage portion in advance; and

a defect judging portion for extracting a defect candidate with reference to the feature site in the detected-image data identified by the position identifying portion and of judging the presence/absence of a defect in the inspection subject based on a characteristic quantity of a defect indicated by defect characteristic data stored in the storage portion in advance and a characteristic quantity of the defect candidate.

2. A defect judging device according to claim 1, wherein the defect judging portion determines a position of the defect candidate with respect to the feature site and judges the presence/absence of a defect in the inspection subject based on the characteristic quantity of the defect indicated by the defect characteristic data in accordance with that position and the characteristic quantity of the defect candidate.

3. A defect judging device according to claim 2, wherein defects whose Euclidean distances are equal to or less than a predetermined threshold are assumed to be a single group, and the defect characteristic data indicate characteristic quantities of the individual groups.

4. A defect judging device according to claim 3,

wherein respective priority ranks are set for the individual groups, and

the defect judging portion judges that the defect candidate contained in a presence range of a group having a higher priority rank is more likely to be a defect.

5. A defect judging device according to claim 2, wherein, in the defect characteristic data, defects are classified in accordance with a plurality of regions determined with reference to the position of the feature site, thus showing the characteristic quantity of the defect for the individual regions.

6. A defect judging device according to claim 1, wherein the defect characteristic data is updated by newly incorporating the characteristic quantity of the defect candidate that has been judged to be a defect.

7. A radiography system comprising:

a radiographic device that radiates radiation onto an inspection subject and obtains detected-image data by detecting radiation that has passed through the inspection subject; and

a defect judging device according to claim 1.

8. A defect judging method that, based on detected-image data obtained by a radiographic device that detects radiation that has passed through an inspection subject, judges the presence/absence of a defect in the inspection subject, the defect judging method comprising:

a first step of identifying a position of a feature site in the detected-image data based on a shape of the feature site of the inspection subject indicated by feature data that are stored in a storage portion in advance; and

a second step of extracting a defect candidate with reference to the feature site in the detected-image data identified in the first step and of judging the presence/absence of a defect in the inspection subject based on a characteristic quantity of a defect indicated by defect characteristic data stored in the storage portion in advance and a characteristic quantity of the defect candidate.