SPEEDING UP DEFECT DIAGNOSIS TECHNIQUES
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Abstract
Fault diagnosis techniques (e.g., effect-cause diagnosis techniques) can be speeded up by, for example, using a relatively small dictionary. Examples described herein exhibit a speed up of effect-cause diagnosis by up to about 160 times. The technologies can be used to diagnose defects using compacted fail data produced by test response compactors. A dictionary of small size can be used to reduce the size of a fault candidate list and also to facilitate procedures to select a subset of passing patterns for simulation. Critical path tracing can be used to handle failing patterns with a larger number of failing bits, and a pre-computed small dictionary can be used to quickly find the initial candidates for failing patterns with a smaller number of failing bits. Also described herein are exemplary techniques for selecting passing patterns for fault simulation to identify faults in an electronic circuit.
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Citations
51 Claims
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1-15. -15. (canceled)
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16. A method of generating a fault dictionary for use in diagnosing faults in an electronic circuit, the method comprising:
for a selected fault, simulating one or more test patterns being applied to the electronic circuit in the presence of the selected fault; determining test responses to the one or more test patterns that indicate the presence of the selected fault using the simulation; and storing, in one or more computer-readable media, a fault dictionary entry that identifies the selected fault and identifies the test responses that indicate the presence of the selected fault. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23)
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24. One or more non-transitory computer-readable media storing instructions configured to cause a computer to perform a method, the method comprising:
for a selected fault, simulating one or more test patterns being applied to the electronic circuit in the presence of the selected fault; determining test responses to the one or more test patterns that indicate the presence of the selected fault using the simulation; and storing a fault dictionary entry that identifies the selected fault and identifies the test responses that indicate the presence of the selected fault. - View Dependent Claims (45, 46, 47, 48, 49, 50, 51)
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25-44. -44. (canceled)
Specification